Bayesian analysis of stochastic process models

Responsibility
David Rios Insua, Fabrizio Ruggeri, Michael P. Wiper.
Language
English.
Imprint
Chichester, United Kingdom : Wiley, 2012.
Physical description
xiii, 290 pages : illustrations ; 24 cm
Series
Wiley series in probability and statistics.

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Librarian view | Catkey: 9718062