2010 2nd International Conference on Reliability, Safety & Hazard [electronic resource] : (ICRESH-2010) : (risk-based technology and physics-of-failure methods)

Responsibility
editors, P.V. Varde ... [et al.].
Imprint
Piscataway, NJ : IEEE, c2010.
Physical description
1 online resource (xv, 651 p) : ill.
Librarian view | Catkey: 9515668