Optical pattern recognition XX [electronic resource] : 16-17 April 2009, Orlando, Florida, United States

Responsibility
David P. Casasent, Tien-Hsin Chao, editors ; sponsored ... by SPIE.
Imprint
Bellingham, Wash. : SPIE, 2009.
Physical description
1 electronic text : ill. (some col.), digital, PDF file.
Series
Proceedings of SPIE--the International Society for Optical Engineering v. 7340.

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