Optical pattern recognition XX [electronic resource] : 16-17 April 2009, Orlando, Florida, United States
- Responsibility
- David P. Casasent, Tien-Hsin Chao, editors ; sponsored ... by SPIE.
- Imprint
- Bellingham, Wash. : SPIE, 2009.
- Physical description
- 1 electronic text : ill. (some col.), digital, PDF file.
- Series
- Proceedings of SPIE--the International Society for Optical Engineering v. 7340.
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