Transmission electron microscopy : physics of image formation
- L. Reimer, H. Kohl.
- 5th ed.
- New York, NY : Springer, c2008
- Physical description
- xvi, 587 p. : ill. ; 25 cm.
- Springer series in optical sciences v. 36.
Engineering Library (Terman)
|QH212 .T7 R43 2008||Unknown|
- Includes bibliographical references (p. -574) and index.
- Introduction.- Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron- Specimen Interactions.- Scattering and Phase Contrast for Amorphous Specimens.- Theory of Electron Diffraction.- Electron Diffraction Modes and Applications.- Imaging of Crystalline Specimens and Their Deffects.- Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy.- Specimen Damage by Electron Irradiation. References.- Index.
- (source: Nielsen Book Data)9780387400938 20160528
- Publisher's Summary
- "Transmission Electron Microscopy" presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.
(source: Nielsen Book Data)9780387400938 20160528
- Publication date
- Springer series in optical sciences ; 36
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