An improved criterion for tightened inspection under the double sampling plans of Mil-Std-105B
- by Barnard E. Smith.
- Stanford, Calif. : Applied Mathematics and Statistics Laboratories, with the cooperation of the Dept. of Industrial Engineering, Stanford University, 1960.
- Physical description
- 1 online resource (12 pages)
- Technical manual - Stanford University. Applied Mathematics and Statistics Laboratories ; no. 2
Also available at
- Publication date
- "Prepared under contract N6onr-25126 (NR-042-002)--for Office of Naval Research."
- Downloaded from http://statistics.stanford.edu/~ckirby/techreports/ONR/LIE2%20ONR%202.pdf on Jun 26, 2013.