Applied logistic regression

Responsibility
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant.
Language
English.
Edition
3rd ed.
Imprint
Hoboken, N.J. : Wiley, c2013.
Physical description
xvi, 500 p. : ill. ; 24 cm.
Series
Wiley series in probability and statistics 398.
Librarian view | Catkey: 10164492