%{search_type} search results

1,994 catalog results

RSS feed for this result
Book
1 v.
Green Library
Book
1 online resource (xv, 712 pages) : digital, PDF file(s).
  • Part I. Introduction: 1. Introduction-- 2. Dependability evaluation-- 3. Dependability metrics defined on a single unit-- Part II. Non-State-Space Models (Combinatorial Models): 4. Reliability block diagram-- 5. Network reliability-- 6. Fault tree analysis-- 7. State enumeration-- 8. Dynamic redundancy-- Part III. State-Space Models with Exponential Distributions: 9. Continuous time Markov chain: availability models-- 10. Continuous time Markov chain: reliability models-- 11. Continuous time Markov chain: queueing systems-- 12. Petri nets-- Part IV. State-Space Models with Non-Exponential Distributions: 13. Non-homogeneous CTMC-- 14. Semi-Markov and Markov regenerative models-- 15. Phase type expansion-- Part V. Multi-Level Models-- 16. Hierarchical models-- 17. Fixed-point iteration-- Part VI. Case Studies: 18. Case studies.
  • (source: Nielsen Book Data)9781107099500 20171030
Do you need to know what technique to use to evaluate the reliability of an engineered system? This self-contained guide provides comprehensive coverage of all the analytical and modeling techniques currently in use, from classical non-state and state space approaches, to newer and more advanced methods such as binary decision diagrams, dynamic fault trees, Bayesian belief networks, stochastic Petri nets, non-homogeneous Markov chains, semi-Markov processes, and phase type expansions. Readers will quickly understand the relative pros and cons of each technique, as well as how to combine different models together to address complex, real-world modeling scenarios. Numerous examples, case studies and problems provided throughout help readers put knowledge into practice, and a solutions manual and Powerpoint slides for instructors accompany the book online. This is the ideal self-study guide for students, researchers and practitioners in engineering and computer science.
(source: Nielsen Book Data)9781107099500 20171030
Book
1 online resource.
Book
1 online resource (26 ) : digital, PDF file.
Box integrals - expectations < rvec r} sup s}> or < rvec r}-{rvec q} sup s}> over the unit n-cube (or n-box) - have over three decades been occasionally given closed forms for isolated n, s. By employing experimental mathematics together with a new, global analytic strategy, we prove that for n ≤ 4 dimensions the box integrals are for any integer s hypergeometrically closed in a sense we clarify herein. For n = 5 dimensions, we show that a single unresolved integral we call K₅ stands in the way of such hyperclosure proofs. We supply a compendium of exemplary closed forms that naturally arise algorithmically from this theory.
Book
1 online resource.
The objective of this work is to develop dense ceramic membranes for separating hydrogen from other gaseous components in a nongalvanic mode, i.e., without using an external power supply or electrical circuitry.
Our work is aimed at providing a data store for system-level events and presenting a flexible query interface to those events. The work extends the functinality provided by the open source Request Tracker (RT) (http://www.bestpractical.com/rt) project witht the Asset Tracker (AT) addon (http://atwiki.chaka.net). We have developed an Event Tracker add-on to RT and an interface for gathering, dispatching, and inserting system events into Event Tracker. Data sources include data from all components of the system. Data is initially sent to a defined set of data filters. The data filters are capable of discarding specified data, throttling input, handling context-sensitive input, passing data through an external shell pipe command, and compressing multiple data enteries into a single event. The filters then pass the data on to an event dispatch engine. The dispatcher can print events to the screen as they happen, track them in the database, forward them on, or pass them on to an external command. By collecting all of the data into a single database, we are able to leverage the Query Builder interface supplied by RT to create, save, and restore almost any kind of query imaginable.
Media & Microtext Center
Book
722 p : ill. ; 23 cm.
Book
1 online resource (ix-xvi, 230 p.) : ill.
Book
119 pages : illustrations ; 28 cm
Medical Library (Lane)
Book
online resource
Medical Library (Lane)
Book
xii, 307 pages : illustrations ; 26 cm
Medical Library (Lane)
Book
1 online resource.
The report provides an overview and examples of high availability design considerations and operational aspects making references to some of the available methods to assess and improve on accelerator reliability.
Book
1 online resource (7 ) : digital, PDF file.
The availability of defect-free masks remains one of the key challenges for inserting extreme ultraviolet lithography (EUVL) into high volume manufacturing. yet link data is available for understanding native defects on real masks. In this paper, a full-field EUV mask is fabricated to investigate the printability of various defects on the mask. The printability of defects and identification of their source from mask fabrication to handling were studied using wafer inspection. The printable blank defect density excluding particles and patterns is 0.63 cm². Mask inspection is shown to have better sensitivity than wafer inspection. The sensitivity of wafer inspection must be improved using through-focus analysis and a different wafer stack.
Book
xxii, 554 p. : ill.
Book
1 online resource (490 Kilobytes pages ) : digital, PDF file.
In this note we describe the first set of tests done with a sample of TriP chips that were mounted on a modified AFE board. The modifications consisted of different firmware and the replacement of one power supply switch. The board used was a standard AFEIc board (red type) on which new MCMs (MCMIIs) were mounted. The new MCMs were designed to support the TriP and emulate the SVX for readout when mounted on an AFEIc board. The TriP and the MCMs are described in Ref. [1]. Two versions of the MCMII were designed and built: one (MCMIIb) supports two TriP chips wirebonded directly to the MCM substrate. The other, (MCMIIc) supports one TriP which can be either wirebonded directly or packaged into a standard TQFP surface mount package. Due to space constraints, this MCM can support only 1 TriP. We tested 6 TriP chips on 3 different MCMIIb (MCMIIb-1, MCMIIb-2 and MCMIIb-3) and 2 other TriPs were tested on MCMIIc, one of them with an unpackaged TriP (MCMIIc-1) and the other with a packaged TriP (MCMIIc-2). A set of 10 programable internal registers control the TriP operation, the description of these registers can be found in [1]. Table 1 shows the values used for the tests described in this note. In Ref. [1] there is a description of the signals that are needed to operate the TriP chip. We implemented in a Field Programable Gate Array (FPGA), also part of the MCM, a set of shift registers that allow us to download via the 1553 interface to the AFE board, any desired timing for the signals that the FPGA has to send to the TriP chip. These registers are run with a 121.21 MHz clock (which is 16x the crossing clock and phase locked to it), which means that each bit corresponds to a time interval of 8.25 nsec. Finer control of timing is possible, but this changing the programing of the FPGA and recompiling. The bits downloaded to these shift registers inside the TriP are listed in Table 2.
Book
xxxiii, 296 p. : ill. ; 21 cm.
  • List of Figures. Foreword. Foreword to the 1996 Edition. Preface. Acknowledgments. About the Author. 1. Basic High Availability Concepts. What Is High Availability? High Availability as a Business Requirement. What Are the Measures of High Availability? Understanding the Obstacles to High Availability. Preparing Your Organization for High Availability. The Starting Point for a Highly Available System. Moving to High Availability. Summary. 2. Clustering to Eliminate Single Points of Failure. Identifying Single Points of Failure. Eliminating Power Sources as Single Points of Failure. Eliminating Disks as Single Points of Failure. Eliminating SPU Components as Single Points of Failure. Eliminating Single Points of Failure in Networks. Eliminating Software as a Single Point of Failure. Implementing a High Availability Cluster. 3. High Availability Cluster Components. Nodes and Cluster Membership. HA Architectures and Cluster Components. Other HA Subsystems. Mission-Critical Consulting and Support Services. 4. Cluster Monitoring and Management. Basics of Monitoring. Event Monitoring Services. HA Monitors. Hardware Monitors. ServiceGuard Manager. High Availability Observatory. System and Network Management Products. ServiceControl Manager. 5. Disaster-Tolerant High Availability Systems. Types of Disasters. Disaster Recovery Planning. Disaster-Tolerant vs. Highly Available. L11Protecting Data from Disaster. Disaster-Tolerant Architectures. Local Clusters. Campus Clusters. Metropolitan Clusters. Continental Clusters. Business Recovery Services. 6. Enterprise-Wide High Availability Solutions. Storage Area Networks. Shared Tape Solutions and HA Omniback. Highly Available SAP. Consolidating Applications in HA Clusters. 5nines:5minutes . 7. Sample High Availability Solutions. Highly Available NFS System for Publishing. Stock Quotation Service. Order Entry and Catalog Application. Insurance Company Database. Disaster-Tolerant Metropolitan Cluster for City Services. SAN Configuration for an Internet Service Provider. Glossary of High Availability Terminology. Index.
  • (source: Nielsen Book Data)9780130893550 20160528
The expert guide to high availability clusters for HP-UX, Linux, Windows 2000, and Windows NT. *The start-to-finish guide to high availability clustering *Includes ways to maximize enterprise application availability--and minimize cost *Completely updated for the latest tools, technologies, and applications *Describes high availability solutions in HP-UX, Linux, and Windows environments Business-critical applications require higher availability than ever before-and today's high availability systems rely on clustering as a key strategy for maximizing reliability and robustness. In Clusters for High Availability, Second Edition, Peter S. Weygant covers all three pillars of successful high availability computing: robust technology, sound computing processes, and proactive support. He addresses every aspect of delivering high availability clustered systems: terminology, architecture, implementation, management, monitoring, and beyond. Coverage includes: *Fundamental concepts and components associated with high availability clustering *A 14-step checklist for assessing your high availability needs *Clustering techniques for HP-UX, Windows 2000, Windows NT, and Linux *Clustered storage, backup, and network infrastructure solutions *Practical techniques for building "disaster-tolerant" systems *State-of-the-art cluster replication, monitoring, and management tools Weygant presents several brand-new case studies, including an Oracle Parallel Server application providing 5nines:5minutes protection; a high availability brokerage application built using a continental cluster; and a storage area network solution designed for an Internet service provider. The book also contains an extensive glossary. If you're responsible for delivering high availability, Clusters for High Availability is the comprehensive, up-to-date blueprint you need.
(source: Nielsen Book Data)9780130893550 20160528
SAL3 (off-campus storage)
SAL3 (off-campus storage)

Articles+

Journal articles, e-books, & other e-resources
Articles+ results include