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Book
xxiii, 960 pages : illustrations (some color) ; 27 cm
Engineering Library (Terman)
MATSCI-153-01
Book
1 online resource
  • Preface to the Second Edition xiii Part I Perfect Crystals 1 1 Lattice Geometry 3 1.1 The Unit Cell 3 1.2 Lattice Plane and Directions 7 1.3 The Weiss Zone Law 11 1.4 Symmetry Elements 14 1.5 Restrictions on Symmetry Elements 16 1.6 Possible Combinations of Rotational Symmetries 21 1.7 Crystal Systems 26 1.8 Space Lattices (Bravais Lattices) 26 Problems 37 Suggestions for Further Reading 40 References 41 2 Point Groups and Space Groups 43 2.1 Macroscopic Symmetry Elements 43 2.2 Orthorhombic System 49 2.3 Tetragonal System 52 2.4 Cubic System 53 2.5 Hexagonal System 56 2.6 Trigonal System 59 2.7 Monoclinic System 63 2.8 Triclinic System 65 2.9 Special Forms in the Crystal Classes 67 2.10 Enantiomorphous Crystal Classes 68 2.11 Laue Groups 69 2.12 Space Groups 69 2.13 Nomenclature for Point Groups and Space Groups 78 2.14 Groups, Subgroups and Supergroups 79 2.15 An Example of a Three-Dimensional Space Group 79 Problems 82 Suggestions for Further Reading 84 References 84 3 Crystal Structures 85 3.1 Introduction 85 3.2 Common Metallic Structures 86 3.3 Related Metallic Structures 93 3.4 Other Elements and Related Compounds 95 3.5 Simple MX and MX 2 Compounds 98 3.6 Other Inorganic Compounds 104 3.7 Interatomic Distances 110 3.8 Solid Solutions 110 3.9 Polymers 113 3.10 Additional Crystal Structures and their Designation 116 Problems 119 Suggestions for Further Reading 121 References 122 4 Amorphous Materials and Special Types of Crystal-Solid Aggregate 123 4.1 Introduction 123 4.2 Amorphous Materials 123 4.3 Liquid Crystals 126 4.4 Geometry of Polyhedra 129 4.5 Icosahedral Packing 134 4.6 Quasicrystals 135 4.7 Incommensurate Structures 137 4.8 Foams, Porous Materials and Cellular Materials 137 Problems 139 Suggestions for Further Reading 139 References 140 5 Tensors 141 5.1 Nature of a tensor 141 5.2 Transformation of components of a vector 142 5.3 Dummy Suffix Notation 145 5.4 Transformation of Components of a Second-Rank Tensor 146 5.5 Definition of a Tensor of the Second Rank 148 5.6 Tensor of the Second Rank Referred to Principal Axes 149 5.7 Limitations Imposed by Crystal Symmetry for Second-Rank Tensors 153 5.8 Representation Quadric 155 5.9 Radius-Normal Property of the Representation Quadric 159 5.10 Third- and Fourth-Rank Tensors 161 Problems 161 Suggestions for Further Reading 163 References 163 6 Strain, Stress, Piezoelectricity and Elasticity 165 6.1 Strain: Introduction 165 6.2 Infinitesimal Strain 166 6.3 Stress 170 6.4 Piezoelectricity 177 6.5 Elasticity of Crystals 181 Problems 193 Suggestions for Further Reading 196 References 196 Section II Imperfect Crystals 197 7 Glide and Texture 199 7.1 Translation Glide 199 7.2 Glide Elements 203 7.3 Independent Slip Systems 208 7.4 Large Strains of Single Crystals: The Choice of Glide System 218 7.5 Large Strains: The Change in the Orientation of the Lattice During Glide 222 7.6 Texture 228 Problems 235 Suggestions for Further Reading 237 References 237 8 Dislocations 241 8.1 Introduction 241 8.2 Dislocation Motion 247 8.3 The Force on a Dislocation 249 8.4 The Distortion in a Dislocated Crystal 253 8.5 Atom Positions Close to a Dislocation 258 8.6 The Interaction of Dislocations with One Another 261 Problems 265 Suggestions for Further Reading 266 References 267 9 Dislocations in Crystals 269 9.1 The Strain Energy of a Dislocation 269 9.2 Stacking Faults and Partial Dislocations 277 9.3 Dislocations in c.c.p. Metals 280 9.4 Dislocations in the Rock Salt Structure 288 9.5 Dislocations in Hexagonal Metals 290 9.6 Dislocations in b.c.c. Crystals 295 9.7 Dislocations in Some Covalent Solids 297 9.8 Dislocations in Other Crystal Structures 301 Problems 301 Suggestions for Further Reading 303 References 303 10 Point Defects 305 10.1 Introduction 305 10.2 Point Defects in Ionic Crystals 309 10.3 Point Defect Aggregates 310 10.4 Point Defect Configurations 312 10.5 Experiments on Point Defects in Equilibrium 317 10.6 Experiments on Quenched Metals 321 10.7 Radiation Damage 324 10.8 Anelasticity and Point Defect Symmetry 326 Problems 329 Suggestions for Further Reading 331 References 331 11 Twinning 335 11.1 Introduction 335 11.2 Description of Deformation Twinning 337 11.3 Examples of Twin Structures 342 11.4 Twinning Elements 350 11.5 The Morphology of Deformation Twinning 354 Problems 358 Suggestions for Further Reading 360 References 360 12 Martensitic Transformations 363 12.1 Introduction 363 12.2 General Crystallographic Features 364 12.3 Transformation in Cobalt 366 12.4 Transformation in Zirconium 369 12.5 Transformation of Indium-Thallium Alloys 374 12.6 Transformations in Steels 379 12.7 Transformations in Copper Alloys 382 12.8 Transformations in Ni-Ti-Based Alloys 383 12.9 Transformations in Nonmetals 384 12.10 Crystallographic Aspects of Nucleation and Growth 385 Problems 387 Suggestions for Further Reading 388 References 389 13 Crystal Interfaces 391 13.1 The Structure of Surfaces and Surface Free Energy 391 13.2 Structure and Energy of Grain Boundaries 397 13.3 Interface Junctions 409 13.4 The Shapes of Crystals and Grains 414 13.5 Boundaries between Different Phases 420 13.6 Strained Layer Epitaxy of Semiconductors 424 Problems 429 Suggestions for Further Reading 431 References 431 Appendix 1 Crystallographic Calculations 435 A1.1 Vector Algebra 435 A1.2 The Reciprocal Lattice 440 A1.3 Matrices 443 A1.4 Rotation Matrices and Unit Quaternions 448 References 449 Appendix 2 The Stereographic Projection 451 A2.1 Principles 451 A2.2 Constructions 455 A2.3 Constructions with the Wulff net 460 A2.4 Proof of the Properties of the Stereographic Projection 465 References 468 Appendix 3 Planar Spacings and Interplanar Angles 469 A3.1 Planar Spacings 469 A3.2 Interplanar Angles 472 Appendix 4 Transformation of Indices Following a Change of Unit Cell 473 A4.1 Change of Indices of Directions 473 A4.2 Change of Indices of Planes 475 A4.3 Example 1: Interchange of Hexagonal and Orthorhombic Indices for Hexagonal Crystals 476 A4.4 Example 2: Interchange of Rhombohedral and Hexagonal Indices 477 Appendix 5 Slip Systems in C.C.P. and B.C.C. Crystals 481 A5.1 Independent Glide Systems in C.C.P. Metals 481 A5.2 Diehl's Rule and the OILS Rule 483 A5.3 Proof of Diehl's Rule and the OILS Rule 485 References 486 Appendix 6 Homogeneous Strain 487 A6.1 Simple Extension 488 A6.2 Simple Shear 488 A6.3 Pure Shear 489 A6.4 The Relationship between Pure Shear and Simple Shear 489 Appendix 7 Crystal Structure Data 491 A7.1 Crystal structures of the Elements, Interatomic Distances and Ionic radii at Room Temperature 491 A7.2 Crystals with the Sodium Chloride Structure 495 A7.3 Crystals with the Caesium Chloride Structure 496 A7.4 Crystals with the Sphalerite Structure 497 A7.5 Crystals with the Wurtzite Structure 497 A7.6 Crystals with the Nickel Arsenide Structure 497 A7.7 Crystals with the Fluorite structure 498 A7.8 Crystals with the Rutile Structure 498 Appendix 8 Further Resources 499 A8.1 Useful Web Sites 499 A8.2 Computer Software Packages 499 Brief Solutions to Selected Problems 501 Index 509.
  • (source: Nielsen Book Data)9780470750155 20160609
Extensively revised and updated, this new edition of a classic text presents a unified approach to crystallography and to the defects found within crystals. The book combines the classical and exact description of symmetry of a perfect crystal with the possible geometries of the major defects-dislocations, stacking faults, point defects, twins, interfaces and the effects of martensitic transformations. A number of important concepts and exciting new topics have been introduced in this second edition, including piezoelectricity, liquid crystals, nanocrystalline concepts, incommensurate materials and the structure of foamed and amorphous solids. The coverage of quasicrystalline materials has been extended, and the data tables, appendices and references have been fully updated. Reinforcing its unrivalled position as the core text for teaching crystallography and crystal defects, each chapter includes problem sets with brief numerical solutions at the end of the book. Detailed worked solutions, supplementary lecture material and computer programs for crystallographic calculations are provided online ( http://booksupport.wiley.com ).
(source: Nielsen Book Data)9780470750155 20160609
The aim of the new edition of Crystallography and Crystal Defects will be to communicate the modern concepts of crystallography in a clear, succinct, manner and to put these concepts into use in the description of line and planar defects in crystalline materials, quasicrystals and crystal interfaces. The book will begin with a chapter on lattice geometry. The second and third chapters will present crystal systems and crystal structures. Tensors, stresses, strain and elasticity and plasticity in crystals will be discussed in chapters four to six, respectively. Chapters 7 and 8 will be dedicated to dislocations and dislocations in crystals. Point defects, deformation twinning and martensitic transformations will be covered in chapters nine to eleven. The book will conclude with a chapter on interfaces in crystals and the appendices.
(source: Nielsen Book Data)9781119961468 20160609
onlinelibrary.wiley.com Wiley Online Library
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MATSCI-153-01
Book
xxiii, 741 p. : ill. ; 24 cm.
  • Fundamentals of Crystalline State and Crystal Lattice.- Finite Symmetry Elements and Crystallographic Point Groups.- Infinite Symmetry Elements and Crystallographic Space Groups.- Formalization of Symmetry.- Nonconventional Symmetry.- Properties, Sources, and Detection of Radiation.- Fundamentals of Diffraction.- The Powder Diffraction Pattern.- Structure Factor.- Solving the Crystal Structure.- Powder Diffractometry.- Collecting Quality Powder Diffraction Data.- Preliminary Data Processing and Phase Analysis.- Determination and Refinement of the Unit Cell.- Solving Crystal Structure from Powder Diffraction Data.- Crystal Structure of LaNi4.85Sn0.15.- Crystal Structure of CeRhGe3.- Crystal Structure of Nd5Si4.- Empirical Methods of Solving Crystal Structures.- Crystal Structure of NiMnO2(OH).- Crystal Structure of , i.tma V3O71.- Crystal Structure of ma2Mo7O221.- Crystal Structure of Mn7(OH)3(VO4)41.- Crystal Structure of FePO4.- Crystal Structure of Acetaminophen, C8H9NO2.
  • (source: Nielsen Book Data)9780387095783 20160605
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example - R solving the crystal structure of Tylenol .
(source: Nielsen Book Data)9780387095783 20160605
dx.doi.org SpringerLink
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MATSCI-153-01
Book
1 online resource (lxii, 760 p., (I1-15)) : ill. (some col.)
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist". '...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!' - "Microscopy and Microanalysis". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron". 'The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin", May 1998. 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
(source: Nielsen Book Data)9780387765006 20160528
dx.doi.org SpringerLink
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MATSCI-153-01, MATSCI-321-01
Book
xiv, 536 p. : ill. (some col.) ; 25 cm.
  • Preface to the Second Edition.Preface to the First Edition.1. The Concept of Microstructure.1.1. Microstructural Features.1.2. Crystallography and Crystal Structure.2. Diffraction Analysis of Crystal Structure.2.1. Scattering of Radiation by Crystals.2.2. Reciprocal Space.2.3. X-ray Diffraction Methods.2.4. Diffraction Analysis.2.5. Electron Diffraction.3. Optical Microscopy.3.1. Geometrical Optics.3.2. Construction of the Microscope.3.3. Specimen Preparation.3.4. Image contrast.3.5. Working with Digital Images.3.6. Resolution, contrast and Image Interpretation.4. Transmission Electron Microscopy.4.1. Basic Principles.4.2. Specimen Preparation.4.3. The Origin of Contrast.4.4. Kinematic Interpretation of Diffraction Contrast.4.5. Dynamic Diffraction and Absorption effects.4.6. Lattice Imaging at High Resolution.4.7. Scanning Transmission Electron Microscopy.5. Scanning Electron Microscopy.5.1. Components of The Scanning electron Microscope.5.2. Electron Beam-Specimen Interactions.5.3. Electron Excitation of X-Rays.5.4. Backscattered Electrons.5.5. Secondary Electron Emission.5.6. Alternative Imaging Modes.5.7. Specimen Preparation and Topology.5.8. Focused Ion Beam Microscopy.6. Microanalysis in Electron Microscopy.6.1. X-Ray Microanalysis.6.2. Electron Energy Loss Spectroscopy.7. Scanning Probe Microscopy and Related Techniques.7.1. Surface Forces and Surface Morphology.7.2. Scanning Probe Microscopes.7.3. Field-Ion Microscopy and Atom Probe tomography.8. Chemical Analysis of Surface Composition.8.1. X-ray Photoelectron Spectroscopy.8.2. Auger Electron Spectroscopy.8.3. Secondary-Ion Mass Spectrometry.9. Quantitative and Tomographic Analysis of Microstructure.9.1. Basic Stereological Concepts.9.2. Accessible and Inaccessible Parameters.9.3. Optimizing Accuracy.9.4. Automated Image Analysis.9.5. Tomography and Three-Dimensional Reconstruction.Appendices.Index.
  • (source: Nielsen Book Data)9780470027851 20160528
Micro structural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. "Micro structural Characterization of Materials, 2nd Edition" is an introduction to the expertise involved in assessing the micro structure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, micro structural morphology, and microanalysis.The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical micro analytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual. "Micro structural Characterization of Materials, 2nd Edition" will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
(source: Nielsen Book Data)9780470027851 20160528
Engineering Library (Terman), eReserve
MATSCI-153-01
Book
xix, 758 p. : ill. ; 24 cm.
  • Diffraction Geometry and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High Resolution TEM Imaging.- Dynamical Theory.- Appendix.
  • (source: Nielsen Book Data)9783540437642 20160528
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
(source: Nielsen Book Data)9783540437642 20160528
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
(source: Nielsen Book Data)9783540738855 20160528
Engineering Library (Terman), eReserve
MATSCI-153-01
Book
xxv, 721, A41, G14, S5, I22 p. : ill. (some col.) ; 27 cm.
Building on the extraordinary success of six best-selling editions, Bill Callister's new Seventh Edition of "Materials Science and Engineering: An Introduction" continues to promote student understanding of the three primary types of materials (metals, ceramics, and polymers) and composites, as well as the relationships that exist between the structural elements of materials and their properties.
(source: Nielsen Book Data)9780471736967 20160528
Engineering Library (Terman)
MATSCI-153-01
Book
1 online resource (xxiii, 713 pages) : illustrations
  • Fundamentals of Crystalline State.- Fundamentals of Diffraction.- Experimental Techniques.- Preliminary Data Processing and Phase Analysis.- Unit Cell Determination and Refinement.- Crystal Structure Determination. Crystal Structure Refinement.- Index.
  • (source: Nielsen Book Data)9780387241470 20160528
"Fundamentals of Powder Diffraction and Structural Characterization of Materials" provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disk containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition, color electronic versions of some 300 illustrations found throughout the book will be included.
(source: Nielsen Book Data)9780387241470 20160528
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MATSCI-153-01
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xxiii, 713 p. : ill. ; 24 cm. + 1 CD-ROM (4 3/4 in.)
  • Fundamentals of Crystalline State.- Fundamentals of Diffraction.- Experimental Techniques.- Preliminary Data Processing and Phase Analysis.- Unit Cell Determination and Refinement.- Crystal Structure Determination. Crystal Structure Refinement.- Index.
  • (source: Nielsen Book Data)9780387241470 20160528
"Fundamentals of Powder Diffraction and Structural Characterization of Materials" provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disk containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition, color electronic versions of some 300 illustrations found throughout the book will be included.
(source: Nielsen Book Data)9780387241470 20160528
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MATSCI-153-01
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xxiii, 713 p. : ill. ; 24 cm. +
  • Fundamentals of Crystalline State.- Fundamentals of Diffraction.- Experimental Techniques.- Preliminary Data Processing and Phase Analysis.- Unit Cell Determination and Refinement.- Crystal Structure Determination. Crystal Structure Refinement.- Index.
  • (source: Nielsen Book Data)9780387241470 20160528
"Fundamentals of Powder Diffraction and Structural Characterization of Materials" provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disk containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition, color electronic versions of some 300 illustrations found throughout the book will be included.
(source: Nielsen Book Data)9780387241470 20160528
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MATSCI-153-01
Book
xix, 680 p. : ill. ; 25 cm.
  • CHAPTER 1: CRYSTAL STRUCTURE. Periodic Array of Atoms. Fundamental Types of Lattices. Index System for Crystal Planes. Simple Crystal Structures. Direct Imaging of Atomic Structure. Nonideal Crystal Structures. Crystal Structure Data. CHAPTER 2: WAVE DIFFRACTION AND THE RECIPROCAL LATTICE. Diffraction of Waves by Crystals.Scattered Wave Amplitude. Brillouin Zones. Fourier Analysis of the Basis. CHAPTER 3: CRYSTAL BINDING AND ELASTIC CONSTANTS. Crystals of Inert Gases. Ionic Crystals. Covalent Crystals. Metals. Hydrogen Bonds. Atomic Radii. Analysis of Elastic Strains. Elastic Compliance and Stiffness Constants. Elastic Waves in Cubic Crystals. CHAPTER 4: PHONONS I. CRYSTAL VIBRATIONS. Vibrations of Crystals with Monatomic Basis. Two Atoms per Primitive Basis. Quantization of Elastic Waves. Phonon Momentum. Inelastic Scattering by Phonons. CHAPTER 5: PHONONS II. THERMAL PROPERTIES. Phonon Heat Capacity. Anharmonic Crystal Interactions. Thermal Conductivity. CHAPTER 6: FREE ELECTRON FERMI GAS. Energy Levels in One Dimension. Effect of Temperature on the Fermi-Dirac Distribution. Free Electron Gas in Three Dimensions. Heat Capacity of the Electron Gas. Electrical Conductivity and Ohm's Law. Motion in Magnetic Fields. Thermal Conductivity of Metals. CHAPTER 7: ENERGY BANDS. Nearly Free Electron Model. Bloch Functions. Kronig-Penney Model. Wave Equation of Electron in a Periodic Potential. Number of Orbitals in a Band. CHAPTER 8: SEMICONDUCTOR CRYSTALS. Band Gap. Equations of Motion. Intrinsic Carrier Concentration. Impurity Conductivity. Thermoelectric Effects. Semimetals. Superlattices. CHAPTER 9: FERMI SURFACES AND METALS. Construction of Fermi Surfaces. Electron Orbits, Hole Orbits, and Open Orbits. Calculation of Energy Bands. Experimental Methods in Fermi Surface Studies. CHAPTER 10: SUPERCONDUCTIVITY. Experimental Survey. Theoretical Survey. High-Temperature Superconductors. CHAPTER 11: DIAMAGNETISM AND PARAMAGNETISM. Langevin Diamagnetism Equation. Quantum Theory of Diamagnetism of Mononuclear Systems.Paramagnetism. Quantum Theory of Paramagnetism. Cooling by Isentropic Demagnetization. Paramagnetic Susceptibility of Conduction Electrons. CHAPTER 12: FERROMAGNETISM AND ANTIFERROMAGNETISM. Ferromagnetic Order. Magnons. Neutron Magnetic Scattering. Ferrimagnetic Order. Antiferromagnetic Order. Ferromagnetic Domains. Single Domain Particles. CHAPTER 13: MAGNETIC RESONANCE. Nuclear Magnetic Resonance. Line Width. Hyperfine Splitting. Nuclear Quadrupole Resonance. Ferromagnetic Resonance. Antiferromagnetic Resonance. Electron Paramagnetic Resonance. Principle of Maser Action. CHAPTER 14: PLASMONS, POLARITONS, AND POLARONS. Dielectric Function of the Electron Gas. Plasmons. Electrostatic Screening. Polaritons. Electron-Electron Interaction. Electron-Phonon Interaction: Polarons. Peierls Instability of Linear Metals. CHAPTER 15: OPTICAL PROCESSES AND EXCITONS. Optical Reflectance. Excitons. Raman Effects in Crystals. Energy Loss of Fast Particles in a Solid. CHAPTER 16: DIELECTRICS AND FERROELECTRICS.Macroscopic Electric Field. Local Electric Field at an Atom. Dielectric Constant and Polarizability. Structural Phase Transitions. Ferroelectric Crystals. Displacive Transitions. CHAPTER 17: SURFACE AND INTERFACE PHYSICS. Surface Crystallography. Surface Electronic Structure. Magnetoresistance in a Two-Dimensional Channel. p-n Junctions. Heterostructures. Semiconductor Lasers. Light-Emitting Diodes. CHAPTER 18: NANOSTRUCTURES.Imaging Techniques for Nanostructures.Electronic Structure of 1D Systems.Electrical Transport in 1D.Electronic Structure of 0D Systems.Electrical Transport in 0D.Vibrational and Thermal Properties of Nanostructures.CHAPTER 19: NONCRYSTALLINE SOLIDS.Diffraction Pattern.Glasses.Amorphous Ferromagnets.Amorphous Semiconductors.Low Energy Excitations in Amorphous Solids.Fiber Optics.CHAPTER 20: POINT DEFECTS.Lattice Vacancies.Diffusion.Color Centers.CHAPTER 21: DISLOCATIONS.Shear Strength of Single Crystals.Dislocations.Strength of Alloys.Dislocations and Crystal Growth.Hardness of Materials.CHAPTER 22: ALLOYS.General Consideration.Substitutional Solid Solutions - Hume-Rotherby Rules.Order-Disorder Transformation.Phase Diagrams.Transition Metal Alloys.Kondo Effect.
  • (source: Nielsen Book Data)9780471415268 20160528
Since the publication of the first edition over 50 years ago, Introduction to Solid State Physics has been the standard solid state physics text for physics students. The author's goal from the beginning has been to write a book that is accessible to undergraduates and consistently teachable. The emphasis in the book has always been on physics rather than formal mathematics. With each new edition, the author has attempted to add important new developments in the field without sacrificing the book's accessibility and teachability. A very important chapter on nanophysics has been written by an active worker in the field. This field is the liveliest addition to solid state science during the past ten years The text uses the simplifications made possible by the wide availability of computer technology. Searches using keywords on a search engine (such as Google) easily generate many fresh and useful references.
(source: Nielsen Book Data)9780471415268 20160528
Engineering Library (Terman)
MATSCI-153-01
Book
xxiii, 713 p. : ill. ; 24 cm. + 1 CD-ROM (4 3/4 in.)
This work provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters 1-3 give essential theoretical background, while chapters 4-7 guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disc containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition colour electronic versions of some 300 illustrations found throughout the book will be included. The book is designed for both the undergraduate and graduate students from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution.
(source: Nielsen Book Data)9781402073656 20160528
Engineering Library (Terman)
MATSCI-153-01
Book
1 online resource (586 pages)
Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This third edition has been extensively revised, including new sections on: variable-pressure SEM, electron backscatter diffraction (EBSD), recent developments in x-ray detectors, and expanded coverage of: low-voltage SEM, X-ray mapping, specimen preparation. The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.
(source: Nielsen Book Data)9780306472923 20160528
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MATSCI-153-01
Book
xii, 470 p. : ill. ; 24 cm.
  • Part 1 Perfect crystals: lattice geometry-- the stereographic projection and point groups-- crystal structures-- tensors. Part 2 Imperfect crystals: strain, stress and elasticity-- glide-- dislocations-- dislocations in crystals-- point defects-- twinning-- Martensitic transformations-- crystal interfaces. Appendices: crystallographic calculations-- vector algebra and the reciprocal lattice-- planar spacings and interplanar angles-- transformation of indices-- crystal structure data.
  • (source: Nielsen Book Data)9780471720430 20160527
The study of form and structure of crystals is multidisciplinary and therefore important in the study of physics, chemistry, molecular biology, materials science and mineralogy. This book combines aspects of crystallography, solid state physics and engineering.
(source: Nielsen Book Data)9780471720430 20160527
Engineering Library (Terman)
MATSCI-153-01
Book
xxvii, 729 p. : ill. ; 29 cm.
  • Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to 'See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.
  • (source: Nielsen Book Data)9780306453243 20160528
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
(source: Nielsen Book Data)9780306453243 20160528
Engineering Library (Terman), eReserve
MATSCI-153-01, MATSCI-321-01