• Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
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• Preface to the Second Edition xiii Part I Perfect Crystals 1
• 1 Lattice Geometry 3 1.1 The Unit Cell 3 1.2 Lattice Plane and Directions 7 1.3 The Weiss Zone Law 11 1.4 Symmetry Elements 14 1.5 Restrictions on Symmetry Elements 16 1.6 Possible Combinations of Rotational Symmetries 21 1.7 Crystal Systems 26 1.8 Space Lattices (Bravais Lattices) 26 Problems 37 Suggestions for Further Reading 40 References 41
• 2 Point Groups and Space Groups 43 2.1 Macroscopic Symmetry Elements 43 2.2 Orthorhombic System 49 2.3 Tetragonal System 52 2.4 Cubic System 53 2.5 Hexagonal System 56 2.6 Trigonal System 59 2.7 Monoclinic System 63 2.8 Triclinic System 65 2.9 Special Forms in the Crystal Classes 67 2.10 Enantiomorphous Crystal Classes 68 2.11 Laue Groups 69 2.12 Space Groups 69 2.13 Nomenclature for Point Groups and Space Groups 78 2.14 Groups, Subgroups and Supergroups 79 2.15 An Example of a Three-Dimensional Space Group 79 Problems 82 Suggestions for Further Reading 84 References 84
• 3 Crystal Structures 85 3.1 Introduction 85 3.2 Common Metallic Structures 86 3.3 Related Metallic Structures 93 3.4 Other Elements and Related Compounds 95 3.5 Simple MX and MX 2 Compounds 98 3.6 Other Inorganic Compounds 104 3.7 Interatomic Distances 110 3.8 Solid Solutions 110 3.9 Polymers 113 3.10 Additional Crystal Structures and their Designation 116 Problems 119 Suggestions for Further Reading 121 References 122
• 4 Amorphous Materials and Special Types of Crystal-Solid Aggregate 123 4.1 Introduction 123 4.2 Amorphous Materials 123 4.3 Liquid Crystals 126 4.4 Geometry of Polyhedra 129 4.5 Icosahedral Packing 134 4.6 Quasicrystals 135 4.7 Incommensurate Structures 137 4.8 Foams, Porous Materials and Cellular Materials 137 Problems 139 Suggestions for Further Reading 139 References 140
• 5 Tensors 141 5.1 Nature of a tensor 141 5.2 Transformation of components of a vector 142 5.3 Dummy Suffix Notation 145 5.4 Transformation of Components of a Second-Rank Tensor 146 5.5 Definition of a Tensor of the Second Rank 148 5.6 Tensor of the Second Rank Referred to Principal Axes 149 5.7 Limitations Imposed by Crystal Symmetry for Second-Rank Tensors 153 5.8 Representation Quadric 155 5.9 Radius-Normal Property of the Representation Quadric 159 5.10 Third- and Fourth-Rank Tensors 161 Problems 161 Suggestions for Further Reading 163 References 163
• 6 Strain, Stress, Piezoelectricity and Elasticity 165 6.1 Strain: Introduction 165 6.2 Infinitesimal Strain 166 6.3 Stress 170 6.4 Piezoelectricity 177 6.5 Elasticity of Crystals 181 Problems 193 Suggestions for Further Reading 196 References 196
• Section II Imperfect Crystals 197
• 7 Glide and Texture 199 7.1 Translation Glide 199 7.2 Glide Elements 203 7.3 Independent Slip Systems 208 7.4 Large Strains of Single Crystals: The Choice of Glide System 218 7.5 Large Strains: The Change in the Orientation of the Lattice During Glide 222 7.6 Texture 228 Problems 235 Suggestions for Further Reading 237 References 237
• 8 Dislocations 241 8.1 Introduction 241 8.2 Dislocation Motion 247 8.3 The Force on a Dislocation 249 8.4 The Distortion in a Dislocated Crystal 253 8.5 Atom Positions Close to a Dislocation 258 8.6 The Interaction of Dislocations with One Another 261 Problems 265 Suggestions for Further Reading 266 References 267
• 9 Dislocations in Crystals 269 9.1 The Strain Energy of a Dislocation 269 9.2 Stacking Faults and Partial Dislocations 277 9.3 Dislocations in c.c.p. Metals 280 9.4 Dislocations in the Rock Salt Structure 288 9.5 Dislocations in Hexagonal Metals 290 9.6 Dislocations in b.c.c. Crystals 295 9.7 Dislocations in Some Covalent Solids 297 9.8 Dislocations in Other Crystal Structures 301 Problems 301 Suggestions for Further Reading 303 References 303
• 10 Point Defects 305 10.1 Introduction 305 10.2 Point Defects in Ionic Crystals 309 10.3 Point Defect Aggregates 310 10.4 Point Defect Configurations 312 10.5 Experiments on Point Defects in Equilibrium 317 10.6 Experiments on Quenched Metals 321 10.7 Radiation Damage 324 10.8 Anelasticity and Point Defect Symmetry 326 Problems 329 Suggestions for Further Reading 331 References 331
• 11 Twinning 335 11.1 Introduction 335 11.2 Description of Deformation Twinning 337 11.3 Examples of Twin Structures 342 11.4 Twinning Elements 350 11.5 The Morphology of Deformation Twinning 354 Problems 358 Suggestions for Further Reading 360 References 360
• 12 Martensitic Transformations 363 12.1 Introduction 363 12.2 General Crystallographic Features 364 12.3 Transformation in Cobalt 366 12.4 Transformation in Zirconium 369 12.5 Transformation of Indium-Thallium Alloys 374 12.6 Transformations in Steels 379 12.7 Transformations in Copper Alloys 382 12.8 Transformations in Ni-Ti-Based Alloys 383 12.9 Transformations in Nonmetals 384 12.10 Crystallographic Aspects of Nucleation and Growth 385 Problems 387 Suggestions for Further Reading 388 References 389
• 13 Crystal Interfaces 391 13.1 The Structure of Surfaces and Surface Free Energy 391 13.2 Structure and Energy of Grain Boundaries 397 13.3 Interface Junctions 409 13.4 The Shapes of Crystals and Grains 414 13.5 Boundaries between Different Phases 420 13.6 Strained Layer Epitaxy of Semiconductors 424 Problems 429 Suggestions for Further Reading 431 References 431
• Appendix 1 Crystallographic Calculations 435 A1.1 Vector Algebra 435 A1.2 The Reciprocal Lattice 440 A1.3 Matrices 443 A1.4 Rotation Matrices and Unit Quaternions 448 References 449
• Appendix 2 The Stereographic Projection 451 A2.1 Principles 451 A2.2 Constructions 455 A2.3 Constructions with the Wulff net 460 A2.4 Proof of the Properties of the Stereographic Projection 465 References 468
• Appendix 3 Planar Spacings and Interplanar Angles 469 A3.1 Planar Spacings 469 A3.2 Interplanar Angles 472
• Appendix 4 Transformation of Indices Following a Change of Unit Cell 473 A4.1 Change of Indices of Directions 473 A4.2 Change of Indices of Planes 475 A4.3 Example
• 1: Interchange of Hexagonal and Orthorhombic Indices for Hexagonal Crystals 476 A4.4 Example
• 2: Interchange of Rhombohedral and Hexagonal Indices 477
• Appendix 5 Slip Systems in C.C.P. and B.C.C. Crystals 481 A5.1 Independent Glide Systems in C.C.P. Metals 481 A5.2 Diehl's Rule and the OILS Rule 483 A5.3 Proof of Diehl's Rule and the OILS Rule 485 References 486
• Appendix 6 Homogeneous Strain 487 A6.1 Simple Extension 488 A6.2 Simple Shear 488 A6.3 Pure Shear 489 A6.4 The Relationship between Pure Shear and Simple Shear 489
• Appendix 7 Crystal Structure Data 491 A7.1 Crystal structures of the Elements, Interatomic Distances and Ionic radii at Room Temperature 491 A7.2 Crystals with the Sodium Chloride Structure 495 A7.3 Crystals with the Caesium Chloride Structure 496 A7.4 Crystals with the Sphalerite Structure 497 A7.5 Crystals with the Wurtzite Structure 497 A7.6 Crystals with the Nickel Arsenide Structure 497 A7.7 Crystals with the Fluorite structure 498 A7.8 Crystals with the Rutile Structure 498
• Appendix 8 Further Resources 499 A8.1 Useful Web Sites 499 A8.2 Computer Software Packages 499 Brief Solutions to Selected Problems
• 501 Index 509.
• (source: Nielsen Book Data)

Extensively revised and updated, this new edition of a classic text presents a unified approach to crystallography and to the defects found within crystals. The book combines the classical and exact description of symmetry of a perfect crystal with the possible geometries of the major defects-dislocations, stacking faults, point defects, twins, interfaces and the effects of martensitic transformations. A number of important concepts and exciting new topics have been introduced in this second edition, including piezoelectricity, liquid crystals, nanocrystalline concepts, incommensurate materials and the structure of foamed and amorphous solids. The coverage of quasicrystalline materials has been extended, and the data tables, appendices and references have been fully updated. Reinforcing its unrivalled position as the core text for teaching crystallography and crystal defects, each chapter includes problem sets with brief numerical solutions at the end of the book. Detailed worked solutions, supplementary lecture material and computer programs for crystallographic calculations are provided online ( http://booksupport.wiley.com ).
(source: Nielsen Book Data)
The aim of the new edition of Crystallography and Crystal Defects will be to communicate the modern concepts of crystallography in a clear, succinct, manner and to put these concepts into use in the description of line and planar defects in crystalline materials, quasicrystals and crystal interfaces. The book will begin with a chapter on lattice geometry. The second and third chapters will present crystal systems and crystal structures. Tensors, stresses, strain and elasticity and plasticity in crystals will be discussed in chapters four to six, respectively. Chapters 7 and 8 will be dedicated to dislocations and dislocations in crystals. Point defects, deformation twinning and martensitic transformations will be covered in chapters nine to eleven. The book will conclude with a chapter on interfaces in crystals and the appendices.
(source: Nielsen Book Data)

• Fundamentals of Crystalline State and Crystal Lattice.- Finite Symmetry Elements and Crystallographic Point Groups.- Infinite Symmetry Elements and Crystallographic Space Groups.- Formalization of Symmetry.- Nonconventional Symmetry.- Properties, Sources, and Detection of Radiation.- Fundamentals of Diffraction.- The Powder Diffraction Pattern.- Structure Factor.- Solving the Crystal Structure.- Powder Diffractometry.- Collecting Quality Powder Diffraction Data.- Preliminary Data Processing and Phase Analysis.- Determination and Refinement of the Unit Cell.- Solving Crystal Structure from Powder Diffraction Data.- Crystal Structure of LaNi4.85Sn0.15.- Crystal Structure of CeRhGe3.- Crystal Structure of Nd5Si4.- Empirical Methods of Solving Crystal Structures.- Crystal Structure of NiMnO2(OH).- Crystal Structure of , i.tma V3O71.- Crystal Structure of ma2Mo7O221.- Crystal Structure of Mn7(OH)3(VO4)41.- Crystal Structure of FePO4.- Crystal Structure of Acetaminophen, C8H9NO2.
• (source: Nielsen Book Data)

A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example - R solving the crystal structure of Tylenol .
(source: Nielsen Book Data)

• pt.
• 1. Basics
• pt.
• 2. Diffraction
• pt.
• 3. Imaging
• pt.
• 4. Spectrometry.

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist". '...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!' - "Microscopy and Microanalysis". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron". 'The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin", May 1998. 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
(source: Nielsen Book Data)

• Preface to the Second Edition.Preface to the First Edition.1. The Concept of Microstructure.1.1. Microstructural Features.1.2. Crystallography and Crystal Structure.2. Diffraction Analysis of Crystal Structure.2.1. Scattering of Radiation by Crystals.2.2. Reciprocal Space.2.3. X-ray Diffraction Methods.2.4. Diffraction Analysis.2.5. Electron Diffraction.3. Optical Microscopy.3.1. Geometrical Optics.3.2. Construction of the Microscope.3.3. Specimen Preparation.3.4. Image contrast.3.5. Working with Digital Images.3.6. Resolution, contrast and Image Interpretation.4. Transmission Electron Microscopy.4.1. Basic Principles.4.2. Specimen Preparation.4.3. The Origin of Contrast.4.4. Kinematic Interpretation of Diffraction Contrast.4.5. Dynamic Diffraction and Absorption effects.4.6. Lattice Imaging at High Resolution.4.7. Scanning Transmission Electron Microscopy.5. Scanning Electron Microscopy.5.1. Components of The Scanning electron Microscope.5.2. Electron Beam-Specimen Interactions.5.3. Electron Excitation of X-Rays.5.4. Backscattered Electrons.5.5. Secondary Electron Emission.5.6. Alternative Imaging Modes.5.7. Specimen Preparation and Topology.5.8. Focused Ion Beam Microscopy.6. Microanalysis in Electron Microscopy.6.1. X-Ray Microanalysis.6.2. Electron Energy Loss Spectroscopy.7. Scanning Probe Microscopy and Related Techniques.7.1. Surface Forces and Surface Morphology.7.2. Scanning Probe Microscopes.7.3. Field-Ion Microscopy and Atom Probe tomography.8. Chemical Analysis of Surface Composition.8.1. X-ray Photoelectron Spectroscopy.8.2. Auger Electron Spectroscopy.8.3. Secondary-Ion Mass Spectrometry.9. Quantitative and Tomographic Analysis of Microstructure.9.1. Basic Stereological Concepts.9.2. Accessible and Inaccessible Parameters.9.3. Optimizing Accuracy.9.4. Automated Image Analysis.9.5. Tomography and Three-Dimensional Reconstruction.Appendices.Index.
• (source: Nielsen Book Data)

Micro structural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. "Micro structural Characterization of Materials, 2nd Edition" is an introduction to the expertise involved in assessing the micro structure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, micro structural morphology, and microanalysis.The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical micro analytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual. "Micro structural Characterization of Materials, 2nd Edition" will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
(source: Nielsen Book Data)

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This third edition has been extensively revised, including new sections on: variable-pressure SEM, electron backscatter diffraction (EBSD), recent developments in x-ray detectors, and expanded coverage of: low-voltage SEM, X-ray mapping, specimen preparation. The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.
(source: Nielsen Book Data)