• 1. Crystals and crystal structures
• 2. Two-dimensional patterns, lattices and symmetry
• 3. Bravais lattices and crystal systems
• 4. Crystal symmetry: point groups, space groups, symmetry-related properties and quasiperiodic crystals
• 5. Describing lattice planes and directions in crystals: Miller indices and zone axis symbols
• 6. The recirocal lattice
• 7. The diffraction of light
• 8. X-ray diffraction: the contribution of Max von Laue, W.H. and W.L. Bragg and P.P Ewald
• 9. The diffraction of X-rays
• 10. X-ray diffraction of polycrystalline materials
• 11. Electron diffraction and its applications
• 12. The stereographic projection and its uses
• 13. Fourier analysis in diffraction and image formation
• 14. The physical properties of crystals and their description by tensors.
• (source: Nielsen Book Data)

This book provides a clear and very broadly based introduction to crystallography, light, X-ray and electron diffraction - a knowledge which is essential to students in a wide range of scientific disciplines but which is otherwise generally covered in subject-specific and more mathematically detailed texts. The text is also designed to appeal to the more general reader since it shows, by historical and biographical references, how the subject has developed from the work and insights of successive generations of crystallographers and scientists. The book shows how an understanding of crystal structures, both inorganic and organic may be built up from simple ideas of atomic and molecular packing. Beginning with (two dimensional) examples of patterns and tilings, the concepts of lattices, symmetry point and space groups are developed. 'Penrose' tilings and quasiperiodic structures are also included. The reciprocal lattice and its importance in understanding the geometry of light, X-ray and electron diffraction patterns is explained in simple terms, leading to Fourier analysis in diffraction, crystal structure determination, image formation and the diffraction-limited resolution in these techniques. Practical X-ray and electron diffraction techniques and their applications are described. A recurring theme is the common principles: the techniques are not treated in isolation. The fourth edition has been revised throughout, and includes new sections on Fourier analysis, Patterson maps, direct methods, charge flipping, group theory in crystallography, and a new chapter on the description of physical properties of crystals by tensors (Chapter 14).
(source: Nielsen Book Data)

• Fundamentals of Crystalline State and Crystal Lattice.- Finite Symmetry Elements and Crystallographic Point Groups.- Infinite Symmetry Elements and Crystallographic Space Groups.- Formalization of Symmetry.- Nonconventional Symmetry.- Properties, Sources, and Detection of Radiation.- Fundamentals of Diffraction.- The Powder Diffraction Pattern.- Structure Factor.- Solving the Crystal Structure.- Powder Diffractometry.- Collecting Quality Powder Diffraction Data.- Preliminary Data Processing and Phase Analysis.- Determination and Refinement of the Unit Cell.- Solving Crystal Structure from Powder Diffraction Data.- Crystal Structure of LaNi4.85Sn0.15.- Crystal Structure of CeRhGe3.- Crystal Structure of Nd5Si4.- Empirical Methods of Solving Crystal Structures.- Crystal Structure of NiMnO2(OH).- Crystal Structure of , i.tma V3O71.- Crystal Structure of ma2Mo7O221.- Crystal Structure of Mn7(OH)3(VO4)41.- Crystal Structure of FePO4.- Crystal Structure of Acetaminophen, C8H9NO2.
• (source: Nielsen Book Data)

A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example - R solving the crystal structure of Tylenol .
(source: Nielsen Book Data)

• pt.
• 1. Basics
• pt.
• 2. Diffraction
• pt.
• 3. Imaging
• pt.
• 4. Spectrometry.

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist". '...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!' - "Microscopy and Microanalysis". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron". 'The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin", May 1998. 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
(source: Nielsen Book Data)

• Preface to the Second Edition.Preface to the First Edition.1. The Concept of Microstructure.1.1. Microstructural Features.1.2. Crystallography and Crystal Structure.2. Diffraction Analysis of Crystal Structure.2.1. Scattering of Radiation by Crystals.2.2. Reciprocal Space.2.3. X-ray Diffraction Methods.2.4. Diffraction Analysis.2.5. Electron Diffraction.3. Optical Microscopy.3.1. Geometrical Optics.3.2. Construction of the Microscope.3.3. Specimen Preparation.3.4. Image contrast.3.5. Working with Digital Images.3.6. Resolution, contrast and Image Interpretation.4. Transmission Electron Microscopy.4.1. Basic Principles.4.2. Specimen Preparation.4.3. The Origin of Contrast.4.4. Kinematic Interpretation of Diffraction Contrast.4.5. Dynamic Diffraction and Absorption effects.4.6. Lattice Imaging at High Resolution.4.7. Scanning Transmission Electron Microscopy.5. Scanning Electron Microscopy.5.1. Components of The Scanning electron Microscope.5.2. Electron Beam-Specimen Interactions.5.3. Electron Excitation of X-Rays.5.4. Backscattered Electrons.5.5. Secondary Electron Emission.5.6. Alternative Imaging Modes.5.7. Specimen Preparation and Topology.5.8. Focused Ion Beam Microscopy.6. Microanalysis in Electron Microscopy.6.1. X-Ray Microanalysis.6.2. Electron Energy Loss Spectroscopy.7. Scanning Probe Microscopy and Related Techniques.7.1. Surface Forces and Surface Morphology.7.2. Scanning Probe Microscopes.7.3. Field-Ion Microscopy and Atom Probe tomography.8. Chemical Analysis of Surface Composition.8.1. X-ray Photoelectron Spectroscopy.8.2. Auger Electron Spectroscopy.8.3. Secondary-Ion Mass Spectrometry.9. Quantitative and Tomographic Analysis of Microstructure.9.1. Basic Stereological Concepts.9.2. Accessible and Inaccessible Parameters.9.3. Optimizing Accuracy.9.4. Automated Image Analysis.9.5. Tomography and Three-Dimensional Reconstruction.Appendices.Index.
• (source: Nielsen Book Data)

Micro structural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. "Micro structural Characterization of Materials, 2nd Edition" is an introduction to the expertise involved in assessing the micro structure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, micro structural morphology, and microanalysis.The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical micro analytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual. "Micro structural Characterization of Materials, 2nd Edition" will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
(source: Nielsen Book Data)

Building on the extraordinary success of six best-selling editions, Bill Callister's new Seventh Edition of "Materials Science and Engineering: An Introduction" continues to promote student understanding of the three primary types of materials (metals, ceramics, and polymers) and composites, as well as the relationships that exist between the structural elements of materials and their properties.
(source: Nielsen Book Data)