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Electronics, Electronique, Condensed state physics, Physique de l'état condensé, Polymers, paint and wood industries, Polymères, industries des peintures et bois, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Electronique, Electronics, Electronique des semiconducteurs. Microélectronique. Optoélectronique. Dispositifs à l'état solide, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Dispositifs optoélectroniques, Optoelectronic devices, Industrie des polymeres, peintures, bois, Polymer industry, paints, wood, Technologie des polymères, Technology of polymers, Domaines d'application, Application fields, Caractéristique temporelle, Time curve, Característica temporal, Caractéristique électrique, Electrical characteristic, Característica eléctrica, Diode électroluminescente, Light emitting diode, Diodo electroluminescente, Effet champ électrique, Electric field effect, Efecto campo eléctrico, Electroluminescence, Electroluminiscencia, Etude expérimentale, Experimental study, Estudio experimental, Mécanisme, Mechanism, Mecanismo, Phénylènevinylène polymère, Phenylenevinylene polymer, Fenilenovinileno polímero, Polymère conjugué, Conjugated polymer, Polímero conjugado, Vieillissement, Ageing, and Envejecimiento

Polymer light-emitting diodes (PLEDs) made with poly(p-phenylene vinylene) (PPV) using a non-ionic precursor route with indium-tin oxide (ITO) as anode and Al as cathode have been examined during continuous electrical stress in an oxygen-rich atmosphere. Three distinct regions in the time evolution of the equivalent electrical resistance and the light output of PLEDs are identified. Various electrical and analytical measurement results are presented to explain the main failure mechanisms. The most severe degradation mode can be identified as dielectric breakdown, resulting in 'hot spots' and ohmic leakage paths. The inhibition of the ohmic path formation by oxidation under ambient conditions results in a local delamination of the electrode, shrinking the active area of the device. This loss of active area caused by these oxidative burn-outs can clearly be observed by scanning electron microscopy ( SEM) and is consistent with secondary ion mass spectroscopy (SIMS) results. Emission microscopy (EMMI) inspection provides evidence for electric field induced ageing at defects present in the device. These defects are already present in the as-produced samples, e.g. particle impurities, interface roughness and structural weakness (edges of the Al electrodes).