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1. Development of a Handheld Sheet Resistance Meter with the Dualconfiguration Four-point Probe Method [2017]

  • Jeon-Hong Kang, Sang-Hwa Lee, and Kwang-Min Yu
  • Journal of Electrical Engineering & Technology. 2017-01 12(3):1314-1319

2. An international Comparison Measurement of Silicon Wafer Sheet Resistance using the Four-point Probe Method [2015]

  • Jeon-Hong Kang, Gao-Ying, Yuh-Chuan Cheng, Chang-Soo Kim, Sang-Hwa Lee, and Kwang-Min Yu
  • Journal of Electrical Engineering & Technology. 2015-01 10(1):325-330

3. Dual-Configuration Four-Point Probe Method에 의한 휴대형 면저항 측정기 개발 [2010]

  • 강전홍(Jeon-Hong Kang), 유광민(Kwang-Min Yu), and 김완섭(Wan-Seop Kim)
  • 전기학회논문지 P. 2010-01 59(4):423-427

4. Single-configuration FPP method에 의한 실리콘 웨이퍼의 비저항 정밀측정 [2011]

  • 강전홍(Jeon-Hong Kang), 유광민(Kwang-Min Yu), 구경완(Kung-Wan Koo), and 한상옥(Sang-Ok Han)
  • 전기학회논문지. 2011-01 60(7):1434-1437

5. Single-Configuration Four-Point Probe method를 이용한 휴대형 면저항 측정기 개발 [2011]

  • 강전홍(J. H. Kang), 유광민(K. M. Yu), 이상화(S. H. Lee), and 박영태(Y. T. Park)
  • 한국정밀공학회 학술발표대회 논문집. 2011-01 2011(6):1045-1046

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