Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
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- Authors:
- DE SCHEPPER, L
DE CEUNINCK, W
LEKENS, G
STALS, L
VANHECKE, B
ROGGEN, J
BEYNE, E
TIELEMANS, L - Author Affiliations:
- Limburgs univ. cent., inst. materials res., 3590 Diepenbeek, Belgium
- Source:
- Quality and reliability engineering international. 10(1):15-26
- Publication Date:
- 1994-01-01
- Language:
- English
- Notes:
- Electronics
- Subjects:
- Control theory, operational research
Automatique, recherche opérationnelle
Sciences exactes et technologie
Exact sciences and technology
Sciences appliquees
Applied sciences
Electronique
Electronics
Essais, mesure, bruit et fiabilité
Testing, measurement, noise and reliability
Diélectrique
Dielectric materials
Dieléctrico
Essai en place
In situ test
Ensayo en sitio
Essai vieillissement accéléré
Accelerated aging test
Ensayo envejecimiento acelerado
Fiabilité
Reliability
Fiabilidad
Mesure
Measurement
Medida
Métallisation
Metallizing
Metalización
Optimisation
Optimization
Optimización
Résistance électrique
Resistor
Resistencia eléctrica(componente) - Format:
- Academic Journal
- Database:
- PASCAL Archive
- Journal:
- Quality and reliability engineering international
- Volume:
- 10
- Issue:
- 1
- Page Start:
- 15
- Page Count:
- 12
- ISSN:
- 07488017
- Publisher:
- Chichester: Wiley, 1994.
- Document Type:
- Article
- Physical Description:
- print, 13 ref
