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• Symbols, Units, and Nomenclature.- Mathematical Basics.- Acoustics.- Astronomy.- Astrophysics and Cosmology.- Atomic and Molecular Collision Processes.- Atomic Spectroscopy.- Biological Physics.- Crystallography.- Earth, Ocean and Atmosphere Physics.- Electricity and Magnetism.- Elementary Particles.- Fluid Dynamics.- Geophysics and Geodesy.- Mechanics.- Medical Physics.- Molecular Spectroscopy and Structure.- Nonlinear Physics and Complexity.- Nuclear Physics.- Optics.- Particle Accelerators and Storage Rings.- Plasma Physics.- Polymer Physics.- Quantum Theory.- Solid State Physics.- Surfaces and Films.- Thermodynamics and Thermophysics.- Practical Lab Data.
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This is a major revision of a classic, best selling reference book. Originally published by the American Institute of Physics under the title "Physics Vade Mecum" in 1981, and then the second edition in 1989 with the new title "A Physicist's Desk Reference", this third edition has been completely updated and modernized to reflect current modern physics. The book is a concise compilation of the most frequently used physics data and formulae with their derivations. This revision has six more chapters than the second edition, outdated chapters dropped, and new chapters added on atmospheric physics, electricity and magnetism, elementary particle physics, fluid dynamics, geophysics, nonlinear physics, particle accelerators, polymer physics, and quantum theory.There is a new last chapter on practical laboratory data. The references and bibliographies have been updated. This book is an indispensable tool for the researcher, professional and student in physics as well as other scientists who use physics data. The editors of this volume are Richard Cohen, author of the first two chapters of PDR and the "Physics Quick Reference Guide"; David Lide, one of the editors of the previous two editions and the editor of the "CRC Handbook of Physics and Chemistry"; and George Trigg, editor of the "Encyclopedia of Physics" and the "Encyclopedia of Applied Physics" (VCH). The market for this classic reference book includes the practicing scientist, including engineers, chemists, and biologists; and students.
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• The Practical Basics of Spectrometry: J. Workman, Optical Spectrometers. J. Workman, UV-VIS-NIR Spectrometry. J. Coates, IR Spectrometry: Sample Preparation and Spectrum Acquisition. J. Duckworth, Spectroscopic Quantitative Analysis. J. Duckworth, Spectroscopic Qualitative Analysis. Reflectance Measurements of Solids: A. Springsteen, Reflectance Spectroscopy: An Overview of Classification and Techniques. J. Workman, Spectroscopy of Solids. A. Springsteen, Standards for Reflectance Measurements. K.A. Snail and L.M. Hanssen, Accurate Measurements of Spectral Reflectance: Directional Hemispherical and Hemispherical Directional Reflectance Measurements Using Conic Mirror Reflectometers. S. McCall, The Bi-directional Reflectance Distribution Function. Practical Application of Spectroscopic Measurement: E.W. Ciurczak, Selecting a Spectroscopic Method by Industrial Application. J. Murray Stewart, Color and Solar Transmittance Measurements. S. White, Optical Spectroscopy of New Materials. J.F. Cordaro, Spectroscopy of Ceramics. E. Ciurczak, Spectroscopy Using Flowing Systems for Chemical, Pharmaceutical, and Biomedical Applications. S. Ghosh, Textile Application of Molecular Spectroscopy. J.M. Stewart, Solar Measurements. Glossary. Appendix.
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This book delineates practical, tested, general methods for ultraviolet, visible, and infrared spectrometry in clear language for novice users, and serves as a reference resource for advanced spectroscopists. "Applied Spectroscopy" includes important information and equations which will be referred to regularly. The book emphasizes reflectance and color measurements due to their common usage in todays spectroscopic laboratories, and contains methods for selecting measurement technique as well as solar and color measurements. It is written by experts in the field, this text covers spectrometry of new materials, ceramics, and textiles, and provides an appendix of practical reference data for spectrometry. This book includes topics such as: Practical aspects of spectrometers and spectrometry; Sample preparation; Chemometrics and calibration practices; Reflectance measurements; and Standard materials measurements. An emphasis is placed on reflectance and color measurements due to their common usage in today's spectroscopic laboratories. Methods for selecting a measurement technique are included as well as solar measurements and reference information on sources, detectors, optical fiber and window materials. Additionally, spectrometry of new materials, ceramics, and textiles are covered by respective experts in their fields. An appendix of practical reference data for spectrometry and an extensive index are also included. Practitioners, researchers, and students will find this book useful in their daily working activity, in teaching, and in studies.
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• Part I: Spectroscopy.
• 1: Spectroscopy of molecular beams: an overview.
• 2: Magnetic and electric resonance spectroscopy.
• 3: Beam-maser spectroscopy.
• 4: Quantum amplifiers and oscillators.
• 5: Metrology with molecular beams.
• 6: Infrared laser spectroscopy.
• 7: Visible and UV spectroscopy: physical aspects.
• 8: Photofragment spectroscopy.
• 9: Fourier-transform microwave spectroscopy.
• 10: Fourier-transform methods: infrared. Part II: Surface Scattering.
• 11: General principles and methods.
• 12: Elastic scattering of atoms.
• 13: Rotational inelastic scattering.
• 14: Single phonon inelastic helium scattering.
• 15: Multiple phonon inelastic scattering.
• 16: Scattering from disordered surfaces.
• 17: Reactive scattering.
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• Part 1 Basic techniques: introduction, G.Scoles
• free jet sources, D.R.Miller
• low energy pulsed beam sources, W.R.Gentry
• other low energy beam sources, H.Pauly
• high energy beam sources, H.Pauly
• detection principles, D.Bassi
• ionization detectors - ion production and mass selection and ion detection, D.Bassi
• spectroscopic detection methods, U.Hefter and K.Bergmann
• accommodation, accumulation and other detection methods, M.Zen
• state selection by non-optical methods, J.Reuss
• state selection via optical methods, K. Bergmann
• velocity selection by mechanical methods, C.J.N.van den Meijdenberg
• velocity measurements via time of flight measurements, D.J.Auerbach
• molecular beams of clusters, S.Leutwyler and M.Kappes
• molecular beam epitaxy, K.Ploog
• molecular beams in high energy physics, U. Valbusa. Part 2 Molecular scattering: general principles and methods, U.Buck
• elastic scattering - integral cross sections, J.Biesen
• differential cross sections, U.Buck
• inelastic scattering - energy loss methods, U.Buck
• inelastic scattering - optical methods, P.J. Dagdigian
• reactive scattering - non-optical methods, Y.T.Lee
• - optical methods, P.J.Dagdigian, scattering experiments which state selectors, S.Stolte
• scattering experiments with laser excited beams, R.Duren
• experiments with spin polarized beams, S.Iannotta.
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This is the second volume of an advanced handbook on experimental molecular beam methods, in which seventeen specialists cover the areas of molecular beam spectroscopy and surface scattering. It is designed to be used both as a reference book in the laboratory and as a supplementary text for graduate courses in spectroscopy and gas-surface interactions. The text is split into two parts dealing with these two topics. The spectroscopy part introduces the special features connected with using beams in spectroscopy and then goes on to discuss the subject, going through the spectrum from low to high frequencies. The surface scattering part introduces general instrumentation problems, followed by a series of chapters in which elastic, rotationally inelastic, single-phonon, multi-phonon and chemical scattering are discussed. Scattering from non-ordered surfaces is covered separately. The emphasis throughout is on experimental methods, which includes discussions on data analysis and calibrations. Numerous examples of data are shown and to allow for the understanding of these the theory underlying the most common measurements is also presented.
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This comprehensive handbook describes new experimental approaches for the growing number of chemists, physicists, and engineers working with atomic and molecular beams. With an emphasis on aspects of design, construction and proper data analysis, contributors explore many topics of microscopic chemical physics such as elastic, inelastic, and reactive molecular collisions, clusters, and free-standing jets. Also included are descriptions of experimental set-ups and examples of data obtained in molecular beam experiments, with clear explanations of their significance and importance. The book is a practical guide that will help in planning the structure of experiments and analysing their results.
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• Partial Contents: Units and Constants. Mathematical Methods. Angular Momentum Theory. Group Theory for Atomic Shells. Dynamical Groups. Computational Techniques. Hydrogenic Wave Functions. Atoms. Atomic Spectroscopy. High Precision Calculations for Helium. Atomic Multipoles. Atoms in Strong Fields. Ion Beam Spectroscopy. Thomas- Fermi and Other Density-Functional Theories. Many-Body Theory of Atomic Structure and Processes. Photoionization of Atoms. Quantum Electrodynamics. Tests of Fundamental Physics. Parity Nonconserving Effects in Atoms Molecules. Molecular Structure. Radiative Transition Probabilities. Molecular Photodissociation. Time-Resolved Molecular Dynamics. Gas Phase Ionic Reactions. Clusters. Infrared Spectroscopy. Laser Spectroscopy in the Submillimeter and Far-Infrared Region. Spectroscopic Techniques: Lasers. Spectroscopic Techniques: Ultraviolet. Scattering Theory. Elastic Scattering: Classical, Quantal and Semiclassical. Orientation and Alignment in Atomic and Molecular Collisions. Positron Collisions. Adiabatic and Diabatic Collision Processes at Low Energies. Ion Atom Charge Transfer Reactions at Low Energies. Continuum Distorted Wave and Wannier Methods. Dielectronic.
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This package summarizes the key ideas, techniques and research results in the field of atomic, molecular and optical physics. It is intended to be of interest to all physicians and engineers, as well as scientists from other disciplines. The CD-ROM duplicates the information in the book.
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Market: Graduate students and professionals in atomic, molecular, and optical physics, as well as those in condensed matter and plasma physics, chemistry, and engineering. This indispensable new resource from AIP Press is the first single volume to bridge the many interrelated disciplines of atomic, molecular, and optical (AMO) physics. Along with a summary of key ideas, techniques, and results, many chapters offer you diagrams of apparatus, graphs, and table of data. From atomic spectroscopy to applications in comets, you'll find contributions from over 100 authors, all leaders in their respective disciplines. Available on CD- ROM.
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• v. 1. Survey of measurement techniques
• v. 2. Recommended measurement techniques and practices.

• Optical Crystals, B. Chai. Optical Glasses, J. Fleming. Optical Plastics, D. Keyes. Optical Liquids, R. Sacher and W. Sacher. Filter Materials, L. Cook. Linear Electrooptic Materials, W. Holland and I. Kaminow. Nonlinear Optical Materials: Organic and Inorganic Materials, S. Singh. Cluster-Inaulator Composites, J. Simmons, B. Potter, Jr., and O. Ochoa. Nonlinear Optical Properties: Inorganic Materials, L. Chase and E. Van Stryland. Organic Materials, A. Garito and M. Kuzyk. Stimulated Raman and Brillouin Scattering, J. Reintjes. Magnetooptic Materials: Crystals and Glasses, M. Neeter, G. Day, and A. Rose. Organic and Inorganic Liquids, E. Munin. Elastooptic Materials, M. Gottlieb and N. Singh. Photorefractive Materials, C. Medrano and P. Gnnter. Nonlinear Optical Phase Conjugation Materials, D. Pepper, M. Minden, H. Brusselbach and M. Klein. Gradient Index Materials, D. Moore. Liquid Crystals, S. Jacobs, K. Marshall, and A. Schmid. Diamond Optics, A. Feldman . Laser Crystals, B.A. Wechsler and D. Sumida. Laser Glasses: Bulk Glasses, C. Rapp. Waveguide Glasses, S. Davey, B. Ainslie, and R. Wyatt. Optical Waveguide Materials: Crystals, P. Hotsentiller. Glasses, A. Bruce. Plastic Optical Fibers, L. Blyler, Jr. Optical Coatings for High Power Lasers, M. Kozlowski, R. Chow, and I. Thomas. Appendices:
• Appendix 1: Abbreviations, Acronyms, and Mineralogical or Common Names of Optical Materials.
• Appendix 2: Abbreviations for Methods of Preparing Optical Materials and Thin Films.
• Appendix 3: Designations of Russian Optical Glasses, L. Glebov and M. Tolstoi. Index. Catalog no. 3507 January 1995, 848 pp., ISBN: 0-8493-3507-8 U.S. $195.95/Outside U.S. $235.00.
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In the "CRC Handbook of Laser Science and Technology: Supplement 2", experts summarize the discovery and properties of new optical materials that have appeared since the publication of Volumes III-V. Included are the latest advances in optical crystals, glasses and plastics, laser host materials, phase conjugation materials, linear electrooptic materials, nonlinear optical materials, magnetooptic materials, elastooptic materials, photorefractive materials, liquid crystals, and thin film coatings. The book also includes expanded coverage of optical waveguide materials and new sections on optical liquids, glass fiber lasers, diamond optics, and gradient index materials.Appendices include designation of Russian optical glasses; abbreviations, acronyms, and mineralogical or common names for optical materials; and abbreviations for methods of preparing optical materials. Extensive tabulations of materials properties with references to the primary literature are provided throughout the supplement. "The CRC Handbook of Laser Science and Technology: Supplement 2" represents the latest volume in the most comprehensive, up-to-date listing of the properties of optical materials for lasers and laser systems, making it an essential reference work for all scientists and engineers working in laser research and development.
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• Normal Vibrations and Absorption Regions of C
• X3. Normal Vibrations and Absorption Regions of CH2X. Normal Vibrations and Absorption Regions of CH
• X2. Normal Vibrations and Absorption Regions of CHX. Normal Vibrations and Absorption Regions of C
• X2. Normal Vibrations and Absorption Regions of C(=X)Y. Normal Vibrations and Absorption Regions of Alkenes and Alkynes. Normal Vibrations and Absorption Regions of Nitrogen Compounds. Normal Vibrations and Absorption Regions of Oxy Compounds. Normal Vibrations and Absorption Regions of Sulfur Compounds. Normal Vibrations and Absorption Regions of Ring Structures. Index.
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The accurate interpretation of infrared spectra of organic structures is an extremely important tool for the analytical chemist. Using up-to-date source material, this volume presents a compilation of the infrared absorption regions of ninety of the most important organic molecular fragments. This highly practical guide introduces the reader to a straightforward technique for determining all the fundamental vibrations of a molecular fragment. The set of normal vibrations and the infrared absorption regions of ninety molecular fragments are then discussed and tabulated. The discussion of each fragment is accompanied by a large number of references. A Guide to the Complete Interpretation of Infrared Spectra of Organic Structures offers the analytical chemist the possibility of a more profound interpretation of infrared spectra. In addition, it assumes only a basic knowledge of infrared spectra, and so will prove very useful for non-specialists who use infrared spectroscopy in analysis.
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• Partial table of contents: GENERAL LINEAR ACOUSTICS. Ray Acoustics for Fluids (D. Weston). Waveguides (P. Davies). Transient Radiation (P. Stepanishen). NONLINEAR ACOUSTICS AND CAVITATION. Cavitation (W. Lauterborn). AEROACOUSTICS AND ATMOSPHERIC SOUND. Infrasound (T. Gabrielson). UNDERWATER SOUND. Ocean Ambient Noise (I. Dyer). Sonar Systems (J. Barger). ULTRASONICS, QUANTUM ACOUSTICS, AND PHYSICAL EFFECTS OF SOUND. Ultrasonic Velocity (J. Cantrell & W. Yost). Thermoacoustic Engines (G. Swift). MECHANICAL VIBRATIONS AND SHOCK. Random Vibration (D. Newland). Acoustic Emission (K. Ono). STATISTICAL METHODS IN ACOUSTICS. Response Statistics of Rooms (M. Tohyama). NOISE: ITS EFFECTS AND CONTROL. Airport Noise (K. Eldred). ARCHITECTURAL ACOUSTICS. Sound in Enclosures (K. Kuttruff). ACOUSTICAL SIGNAL PROCESSING. Statistical Theory of Acoustic Signals (A. Piersol). PHYSIOLOGICAL ACOUSTICS. Acoustical Characteristics of the Outer Ear (E. Shaw). PSYCHOLOGICAL ACOUSTICS. Auditory Masking (S. Buus). Loudness (B. Scharf). SPEECH COMMUNICATION. Acoustical Analysis of Speech (G. Fant). MUSIC AND MUSICAL ACOUSTICS. Brass Instruments (J. Bowsher). ACOUSTICAL MEASUREMENTS AND INSTRUMENTATION. Analyzers (J. Pope). TRANSDUCERS. Loudspeaker Design (B. Starobin). Index.
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Acoustical engineers, researchers, architects, and designers need a comprehensive, single-volume reference that provides quick and convenient access to important information, answers and questions on a broad spectrum of topics, and helps solve the toughest problems in acoustical design and engineering. The Handbook of Acoustics meets that need. It offers concise coverage of the science and engineering of acoustics and vibration. In more than 100 clearly written chapters, experts from around the world share their knowledge and expertise in topics ranging from basic aerodynamics and jet noise to acoustical signal processing, and from the interaction of fluid motion and sound to infrasound, ultrasonics, and quantum acoustics. Topics covered include: General linear acoustics Nonlinear acoustics and cavitation Aeroacoustics and atmospheric sound Mechanical vibrations and shock Statistical methods in acoustics Architectural acoustics Physiological acoustics Underwater sound Ultrasonics, quantum acoustics, and physical aspects of sound Noise: its effects and control Acoustical signal processing Psychological acoustics Speech communication Music and musical acoustics Acoustical measurements and instrumentation Transducers The Handbook of Acoustics belongs on the reference shelf of every engineer, architect, research scientist, or designer with a professional interest in the propagation, control, transmission, and effects of sound.
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• Introduction.- Optics of Nonlinear Crystals.- Properties of Nonlinear Optical Crystals.- Applications of Nonlinear Crystals.
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This is the third revised edition of the book originally published in 1991. It provides a complete description of the properties and applications of nonlinear crystals. In addition, it presents the most important equations for calculating the main parameters of nonlinear frequency converters. This comprehensive reference work is now updated and will be of great value to all scientists and engineers working in nonlinear optics, quantum electronics and laser physics.
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• Determination of Optical Constants: E.D. Palik, Introductory Remarks. R.T. Holm, Convention Confusions. E. Pelletier, Methods for Determining Optical Parameters of Thin Films. G.J. Sprokel and J.D. Swalen, The Attenuated Total Reflection Method. P. Apell and O. Hunderi, Optical Properties of Superlattices. B. Jensen, Calculation of the Refractive Index of Compound Semiconductors below the Band Gap. A.R. Forouhi and I. Bloomer, Calculation of Optical Constants, n and k in the Interband Region. M.E. Thomas, Temperature Dependence of the Complex Index of Refraction. M.L. Scott, Measurement of n and k in the XUV by the Angle-of-Incidence Total-External-Reflectance Method. J. Barth, R.L. Johnson, and M. Cardona, Spectroscopic Ellipsometry in the 6-35 eV Region. R. Tatchyn, Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Film Optical Constants in the VUV/Soft X-Ray Range. H.G. Birken, C. Blessing, and C. Kunz, Determination of Optical Constants from Angular-Dependent Photoelectric-Yield Measurements. J. Pfl*aduger and J. Fink, Determination of Optical Constants by High-Energy Electron*b1Energy*b1Loss Spectroscopy (EELS). E.D. Palik, Optical Parameters for the Materials in Volumes I and II. Critiques: Metals: D.W. Lynch and W.R. Hunter, An Introduction to the Data for Several Metals. E.T. Arakawa, T.A. Callcott, and Y.-C. Chang, Beryllium (Be). L. Ward, Cobalt (Co). A. Borghesi and G. Guizzetti, Graphite (C). E.T. Arakawa and T. Inagaki, Mercury (Hg). A. Borghesi and A. Piaggi, Palladium (Pd). G. Guizzetti and A. Piaggi, Vanadium (V). Semiconductors: E.D. Palik, O.J. Glembocki, and K. Takarabe, Aluminum Arsenide (AlAs). D.F. Edwards and R.H. White, Aluminum Antimonide (AlSb). O.J. Glembocki and K. Takarabe, Aluminum Gallium Arsenide (AlxGal-xAs). H. Piller, Cadmium Selenide (CdSe). L. Ward, Cadmium Sulphide (CdS). D.F. Edwards and R.H. White, Gallium Antimonide (GaSb). J. Huml*aai*ajcek, F. Lukes*ajs, and E. Schmidt, Silicon-Germanium Alloys (SixGel-x). H. Piller, Lead Tin Telluride (PbSnTe). P. Amirtharaj, Mercury Camdium Telluride (Hg1-xCdxTe). E.D. Palik, Selenium (Se). S.A. Alterovitz and J.A. Woollam, Cubic Silicon Carbide (GREEK BETA*****)-SiC. E.D. Palik, Tellurium (Te). H. Piller, Tin Telluride (SnTe). L. Ward, Zinc Selenide (ZnSe), Zinc Telluride (ZnTe). Insulators: F. Gervais, Aluminum Oxide (A1203). W.J. Tropf and M.E. Thomas, Aluminum Oxynitride (ALON) Spinel. C. Wong, Y.Y. Teng, J. Ashok, and P.L.H. Varaprasad, Barium Titanate (BaTiO3). D.F. Edwards and R.H. White, Beryllium Oxide (BeO). D.F. Bezuidenhout, Calcium Fluoride (CaF2). S.A. Alterovitz, N. Savvides, F.W. Smith, and J.A. Woollam, Amorphous Hydrogenated "Diamondlike" Carbon Films and Arc-Evaporated Carbon Films. J.E. Eldridge, Cesium Iodide (CsI). C.G. Ribbing and A. Roos, Copper Oxides (Cu2O, CuO). W.J. Tropf and M.E. Thomas, Magnesium Aluminum Spinel (MgAl2O4). T.M. Cotter, M.E. Thomas, and W.J. Tropf, Magnesium Fluoride (MgF2). D.M. Roessler and D.R. Huffman, Magnesium Oxide (MgO). J. Ashok, P.L.H. Varaprasad, and J.R. Birch, Polyethylene (C2H4)n. E.D. Palik, Potassium Bromide (KBr). D.F. Edwards and R.H. White, Potassium Dihydrogen Phosphate (KH2PO4, KDP) and Three of Its Isomorphs. I. Ohl*aaidal and K. Navr*aaatil, Sodium Fluoride (NaF). F. Gervais, Strontium Titanate (SrTiO3). I. Ohl*aaidal and K. Navr*aaatil, Thorium Fluoride (ThF4). M.R. Querry, D.M. Wieliczka, and D.J. Segelstein, Water (H2O). W.J. Tropf and M.E. Thomas, Yttrium Oxide (Y2O3). Each
• chapter includes references. Index.**.
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• List of Contributors. Preface. E.D. Palik, Introductory Remarks. T.J. Parker, K.A. Maslin, and G. Mirjalli, Determination of the Far Infrared Optical Constants of Solids by Dispersive Fourier Transform Spectroscopy.A. Mandelis, Photothermal/Photoacoustic Spectroscopic Measurements of Optical Absorption Coefficients in Semiconductors. M.E. Briggs, Photothermal Deflection Measurements of the Extinction Coefficient k. H. Boukari and N. Lagakos, Determination of Optical Constants by Brillouin Scattering. M. Auslender and S. Hava, Doped n-Type Silicon (n-Si). E.D. Palik, Optical Parameters for the Materials in HOC I, II, III. References. Critiques-Metals: Introduction to the Data for Several Metals. L. Ward, Optical Constants of Eight Rare Earth Elements. T. Inagaki and E.T. Arakawa, Cesium (Cs). C.G. Rinning and A. Roos, Zirconium Nitride (ZrN). C.G. Ribbing and A. Roos, Hafnium Nitride (HfN). Critiques--Semiconductors: Aluminum Nitride (AiN). E.D. Palik, Bismuth Silicon Oxide (Bi12siO20). E.D. Palik, Bismuth Germanium Oxide (Bi12GeO20). G.L. Doll, Boron Nitride (Bn). J.C. Riff, Cadmium Germanium Arsenide (CuGaS2). J.C. Riff, Copper Gallium Sulfide (CuGaS2). D.F. Edwards, Gallium Selenide (GaSe). D.F. Edwards, Gallium Telluride, (GaTe). E.D Palik, Iron Pyrite (FeS2). J. Geist, Silicon (Si) Revisited.D.F. Edwards, Silicon (Si) Revisited. J. Humlicek, Silicon-Germanium Alloys (SixGe1-x). M. Tazawa and A, Handi, Silver Chloride (AgCl)
• Silver Bromide (AgBr)
• Silver Iodide (AgI). L. Artus, Silver Gallium Sulfide (AgGaS2). Silver Gallium Selenide (AgGaSe2). J. Misiewicz and K. Jezierski, Zinc Arsenide (Zn3As2). Zinc Phosphide (Zn3P2). J.C. Rife, Zinc Germanium Phosphide (ZnGeP2). Critiques--Insulators: M.E. Thomas and W.J. Thopf, Aluminum Oxide (Al2O3). Revisited. W.J. Tropf, Calcium Carbonate (CaCO3). W.J. Moore, Cesium Bromide (CsBr). J.E. Eldridge, Cesium Chloride (CsCl). J.E. Eldridge, Cesium Fluoride (CsF). D.F. Edwards, Gallium Oxide (Ca2O3). M.A.F. Destro and A. Damiao, Lead Fluoride (PbF2). F. Gervais and V. Fonseca, Lithium Tantalate (LiTaO3). M.E. Thomas, Potassium Iodide (KI). I. Biaggio, Potassium Niobate (KNbO3). I. Ohlidal and D. Franta, Rubidium Iodide (RbI). E.D. Palik and R. Khanna, Sodium Nitrate (NaNO3). M.E. Thomas, Stronium Fluoride (SrF2). K.A. Fuller, H.D. Downing, and M.R. Querry, Orthorhomic Sulfur (-S). W.J. Tropf, Cubic Thallium (I) Halides. W.J. Tropf, Yttrium Aluminum Garnet (Y3Al5O12). E.D. Palik and R. Khanna, Zircon (ZrSiO4).
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• VOLUME ONE: Determination of Optical Constants: E.D. Palik, Introductory Remarks. R.F. Potter, Basic Parameters for Measuring Optical Properties. D.Y. Smith, Dispersion Theory, Sum Rules, and Their Application to the Analysis of Optical Data. W.R. Hunter, Measurement of Optical Constants in the Vacuum Ultraviolet Spectral Region. D.E. Aspnes, The Accurate Determination of Optical Properties by Ellipsometry. J. Shamir, Interferometric Methods for the Determination of Thin-Film Parameters. P.A. Temple, Thin-Film Absorplance Measurements Using Laser Colorimetry. G.J. Simonis, Complex Index of Refraction Measurements of Near-Millimeter Wavelengths. B. Jensen, The Quantum Extension of the Drude--Zener Theory in Polar Semiconductors. D.W. Lynch, Interband Absorption--Mechanisms and Interpretation. S.S. Mitra, Optical Properties of Nonmetallic Solids for Photon Energies below the Fundamental Band Gap. Critiques--Metals: D.W. Lynch and W.R. Hunter, Comments of the Optical Constants of Metals and an Introduction to the Data for Several Metals. D.Y. Smith, E. Shiles, and M. Inokuti, The Optical Properties of Metallic Aluminum. Critiques--Semiconductors: E.D. Palik, Cadium Telluride (CdTe). E.D. Palik, Gallium Arsenide (GaAs). A. Borghesi and G. Guizzetti, Gallium Phosphide (GaP). R.F. Potter, Germanium (Ge). E.D. Palik and R.T. Holm, Indium Arsenide (InAs). R.T. Holm, Indium Antimonide (InSb). O.J. Glembocki and H. Piller, Indium Phosphide (InP). G. Bauer and H. Krenn, Lead Selenide (PbSe). G. Guizzetti and A. Borghesi, Lead Sulfide (PbS). G. Bauer and H. Krenn, Lead Telluride (PbTe). D.F. Edwards, Silicon (Si). H. Piller, Silicon (Amorphous) (-Si). W.J. Choyke and E.D. Palik, Silicon Carbide (SiC). E.D. Palik and A. Addamiano, Zinc Sulfide (ZnS). Critiques--Insulators: D.J. Treacy, Arsenic Selenide (As<->2<<$>gt--Se<->3<<$>gt--). D.J. Treacy, Arsenic Sulfide (As<->2<<$>gt--S<->3<<$>gt--). D.F. Edwards and H.R. Philipp, Cubic Carbon (Diamond). E.D. Palik and W.R. Hunter, Litium Fluoride (LiF). E.D. Palik, Lithium Niobote (LiNbO<->3<<$>gt--). E.D. Palik, Potassium Chloride (KCl). H.R. Philipp, Silicon Dioxide (SiO<->2<<$>gt--), Type ( (Crystalline). H.R. Philipp, Silicon Dioxide (SiO<->2<<$>gt--) (Glass). <<$>gt--H.R. Philipp, Silicon Monoxide (SiO) (Noncrystalline). H.R. Philipp, Silicon Nitride (Si<->3<<$>gt--N<->4<<$>gt--) (Noncrystalline). J.E. Eldridge and E.D. Palik, Sodium Chloride (NaCl). M.W. Ribarsky, Titanium Dioxide (TiO<->2<<$>gt--) (Rutile).
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This handbook - a sequel to the widely used "Handbook of Optical Constants of Solids" - contains critical reviews and tabulated values of indexes of refraction (n) and extinction coefficients (k) for almost 50 materials that were not covered in the original handbook. For each material, the best known n and k values have been carefully tabulated, from the x-ray to millimeter-wave region of the spectrum by expert optical scientists. In addition, the handbook features thirteen introductory chapters that discuss the determination of n and k by various techniques. Contributors have decided the best values for n and k. References in each critique allow the reader to go back to the original data to examine and understand where the values have come from. It allows the reader to determine if any data in a spectral region needs to be filled in. It gives a wide and detailed view of experimental techniques for measuring the optical constants n and k. It incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant.
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This is the third volume of the very successful set. This updated volume will contain non-linear properties of some of the most useful materials as well as chapters on optical measurement techniques. Contributors have decided the best values for n and k. References in each critique allow the reader to go back to the original data to examine and understand where the values have come from. It allows the reader to determine if any data in a spectral region needs to be filled in. It gives a wide and detailed view of experimental techniques for measuring the optical constants n and k. It incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant.
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While bits and pieces of the index of refraction n and extinction coefficient k for a given material can be found in several handbooks, the "Handbook of Optical Constants of Solids" gives for the first time a single set of n and k values over the broadest spectral range (ideally from x-ray to mm-wave region). The critiquers have chosen the numbers for you, based on their own broad experience in the study of optical properties. Whether you need one number at one wavelength or many numbers at many wavelengths, what is available in the literature is condensed down into a single set of numbers. Contributors have decided the best values for n and k. References in each critique allow the reader to go back to the original data to examine and understand where the values have come from. It allows the reader to determine if any data in a spectral region needs to be filled in. It gives a wide and detailed view of experimental techniques for measuring the optical constants n and k. It incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant.
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• Geometrical Optics Principles Wave Nature of Light and Fermat's Principle Reflection and Refraction Laws Basic Meridional Ray Tracing Equations Gaussian or First-Order Optics Image Formation Stop, Pupils, and Principal Ray Delano's Relation Optical Sine Theorem Lagrange Invariant Herschel Invariant and Image Magnifications Thin Lenses and Spherical Mirrors Thin Lenses Formulas for Image Formation with Thin Lenses Nodal Points of A Thin Lens Image Formation with Converging Lenses Image Formation with Diverging Lenses Systems of Several Lenses and Thick Lenses Focal Length and Power of A Lens System Image Formation with Thick Lenses or Systems of Lenses Cardinal Points Image Formation with A Tilted or Curved Object Thick Lenses Systems of Thin Lenses The Lagrange Invariant in A System of Thin Lenses Effect of Object or Stop Shifting The Delano y - y Diagram Chromatic Aberrations Introduction Axial Chromatic Aberration Conrady's D - d Method of Achromatization Secondary Color Aberration Magnification Chromatic Aberration Spherical Aberration Spherical Aberration Calculation Primary Spherical Aberration Aspherical Surfaces Spherical Aberration of Aspherical Surfaces Surfaces without Spherical Aberration Aberration Polynomial for Spherical Aberration High-Order Spherical Aberration Spherical Aberration Correction with Gradient Index Monochromatic Off-Axis Aberrations Introduction Petzval Curvature Coma Astigmatism Aplanatic Surfaces Distortion Off-Axis Aberrations in Aspherical Surfaces The Symmetrical Principle and the Bow-Sutton Conditions Stop Shift Equations Aberrations of the Pupil Aberration Polynomials and High-Order Aberrations Wavefronts in an Optical System Ray Aberrations and Wavefront Aberrations Wavefront Aberration Polynomial Zernike Polynomials Fitting of Wavefront Deformations to A Polynomial Wavefront Representation by an Array of Gaussians Wavefront Aberrations in Refractive Surfaces Wavefront Aberrations in Reflective Surfaces Aldis Theorem Computer Evaluation of Optical Systems Transverse Aberration Polynomials Transverse Aberrations with H.H. Hopkins, Seidel, and Buchdahl Coefficients Meridional Ray Tracing and Stop Position Analysis Spot Diagram Wavefront Deformation Point and Line Spread Function Optical Transfer Function Tolerance to Aberrations Diffraction in Optical Systems Huygens-Fresnel Theory Fresnel Diffraction Fraunhofer Diffraction Diffraction Images with Aberrations Strehl Ratio Optical Transfer Function Resolution Criteria Gaussian Beams Prisms Tunnel Diagram Deflecting A Light Beam Transforming an Image Deflecting and Transforming Prisms Nondeflecting Transforming Prisms Beam-Splitting Prisms Chromatic Dispersing Prisms Nonimaging Prisms Basic Optical Systems and Simple Photographic Lenses Optical Systems Diversity Magnifiers and Single Imaging Lens Landscape Lenses Periscopic Lens Achromatic Landscape Lens Doublets Laser Light Collimators Spherical and Paraboloidal Mirrors Some Catoptric and Catadioptric Systems F-Theta Lenses Fresnel Lenses and Gabor Plates Complex Photographic Lenses Introduction Asymmetrical Systems Symmetrical Anastigmat Systems Varifocal and Zoom Lenses The Human Eye and Ophthalmic Lenses The Human Eye Ophthalmic Lenses Ophthalmic Lens Design Prismatic Lenses Spherocylindrical Lenses Astronomical Telescopes Resolution and Light-Gathering Power Reflecting Two-Mirror Cameras and Telescopes Catadioptric Cameras Astronomical Telescopes Field Correctors Multiple-Mirror Telescopes Active and Adaptive Optics Visual Systems and Afocal Systems Visual Optical Systems Basic Telescopic System Afocal Systems Visual And Terrestrial Telescopes Telescope Eyepieces Relays and Periscopes Microscopes Compound Microscope Microscope Objectives Microscope Eyepieces Microscope Illuminators Projection Systems Image Projectors Main Projector Components Coherence Effects in Projectors Anamorphic Projection Slide and Movie Projectors Overhead Projectors Profile Projectors Television Projectors LCD Computer and Home Theater Projectors Lens Design Optimization Basic Principles Optimization Methods Glatzel Adaptive Method Constrained Damped Least-Squares Optimization Method Merit Function and Boundary Conditions Modern Trends in Optical Design Flowchart for a Lens Optimization Program Practical Tips for the Use of Lens Evaluation Programs Some Commercial Lens Design Programs Appendices Appendix: Notation and Primary Aberration Coefficients Summary Appendix: Mathematical Representation of Optical Surfaces Appendix: Optical Materials Appendix: Exact Ray Tracing of Skew Rays Appendix: General Bibliography on Lens Design Index Chapters include references.
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Handbook of Optical Design, Third Edition covers the fundamental principles of geometric optics and their application to lens design in one volume. It incorporates classic aspects of lens design along with important modern methods, tools, and instruments, including contemporary astronomical telescopes, Gaussian beams, and computer lens design. Written by respected researchers, the book has been extensively classroom-tested and developed in their lens design courses. This well-illustrated handbook clearly and concisely explains the intricacies of optical system design and evaluation. It also discusses component selection, optimization, and integration for the development of effective optical apparatus. The authors analyze the performance of a wide range of optical materials, components, and systems, from simple magnifiers to complex lenses used in photography, ophthalmology, telescopes, microscopes, and projection systems. Throughout, the book includes a wealth of design examples, illustrations, and equations, most of which are derived from basic principles. Appendices supply additional background information. What's New in This Edition * Improved figures, including 32 now in color * Updates throughout, reflecting advances in the field * New material on Buchdahl high-order aberrations * Expanded and improved coverage of the calculation of wavefront aberrations based on optical path * An updated list of optical materials in the appendix * A clearer, more detailed description of primary aberrations * References to important new publications * Optical system design examples updated to include newly available glasses *25 new design examples This comprehensive book combines basic theory and practical details for the design of optical systems. It is an invaluable reference for optical students as well as scientists and engineers working with optical instrumentation.
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• CRYSTALLINE MATERIALS Introduction Physical Properties Optical Properties Mechanical Properties Thermal Properties Magnetooptic Properties Electrooptic Properties Elastooptic Properties Nonlinear Optical Properties GLASSES Introduction Commercial Optical Glasses Specialty Optical Glasses Fused Silica Fluoride Glasses Chalcogenide Glasses Magnetooptic Properties Electrooptic Properties Elastooptic Properties Nonlinear Optical Properties Special Glasses POLYMERIC MATERIALS Optical Plastics Index of Refraction Nonlinear Optical Properties Thermal Properties Engineering Data METALS Physical Properties of Selected Metals Optical Properties Mechanical Properties Thermal Properties Mirror Substrate Materials LIQUIDS Introduction Water Physical Properties of Selected Liquids Index of Refraction Nonlinear Optical Properties Magnetooptic Properties Commercial Optical Liquids GASES Introduction Physical Properties of Selected Gases Index of Refraction Nonlinear Optical Properties Magnetooptic Properties Atomic Resonance Filters APPENDICES Safe Handling of Optical Materials Abbreviations, Acronyms, and Mineralogical or Common Names for Optical Materials Abbreviations for Methods of Preparing Optical Materials and Thin Films Fundamental Physical Constants Units and Conversion Factors.
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For years scientists turned to the "CRC Handbook of Laser Science and Technology" for reliable data on optical materials. Out of print for several years, that standard-setting work now has a successor: "The Handbook of Optical Materials". This new handbook is an authoritative compilation of the physical properties of materials used in all types of lasers and optical systems. In it, scientist, author, and editor Dr. Marvin J. Weber provides extensive data tabulations and references for the most important optical materials, including crystals, glasses, polymers, metals, liquids, and gases.The properties detailed include both linear and nonlinear optical properties, mechanical properties, thermal properties together with many additional special properties, such as electro-, magneto-, and elasto-optic properties. Using a minimum of narration and logically organized by material properties, the handbook's unique presentation simplifies the process of comparing different materials for their suitability in particular applications. Appendices furnish a wealth of other useful information, including lists of the many abbreviations and acronyms that proliferate in this field. "The Handbook of Optical Materials" is simply the most complete one-stop source available for materials data essential to lasers and optical systems.
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• Introduction. Fundamentals of Optical Elements and Devices. Light Sources. Lenses, Prisms and Mirrors. Optoelectronic Sensors. Optical Devices and Optomechanical Elements. Fundamentals Principles and Techniques for Metrology. Propagation of Light. Interferometry. Holography. Speckle Methods and Applications. Moire Metrology. Optical Heterodyne Measurement Method. Diffraction. Scattering. Polarization. Near-Field Optics. Practical Applications. Length and Size. Displacement. Straightness and Parallelism. Flatness. Surface Profilometry. Three-Dimensional Shape Measurement. Fringe Analysis. Photogrammetry. Optical Methods in Solid Mechanics. Optical Methods in Flow Measurement. Polarimetry. Birefringence Measurement. Ellipsometry. Optical Thin Film and Coatings. Film Surface and Thickness Profilometry. On-Machine Measurement.
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Carefully designed to make information accessible without sacrificing coverage of advanced topics, this book discusses fundamental principles and techniques before exploring practical applications of optical methods. It includes contributions from veterans of the field and up-and-coming researchers. The editor draws on his experience in teaching and industry to provide a resource that both authoritative and practical.
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• Units of Physical Quantities, A.G. Chertov Periodic Table of Elements, K.A. Kikoin Mechanical Properties of Materials, N.V. Kadobnova and A.M. Bratkovski Compressibility, B.V. Vinogradov Density of Substances, A.P. Babichev Friction, I.I. Karasik Acoustics, L.K. Zarembo Thermometry, A.V. Inyushkin Heat Capacity, M.N. Khlopkin Temperature Coefficients of Expansion, E.B. Gel 'man Saturated Vapor Pressure, V.V. Ignatiev, V.A. Krivoruchko and A.I. Migachev Melting and Boiling, E.B. Gel 'man Equation of State and Critical Parameters of Substances, E.B. Gel 'man Surface Tension, B.D. Summ Heat Conduction, A.V. Inyushkin Viscosity, A.V. Eletskii Diffusion, A.V. Eletskii Elementary Processes in Gases and Plasma, A.V. Eletskii Ionization of Atoms and Molecules, A.A. Radzig and V.M. Shustryakov Transport Phenomena in Weakly Ionized Plasma, A.V. Eletskii Electric Characteristics of Metals and Alloys, V.S. Egorov and I.N. Khlyustikov Electrophysical Properties of Semiconductors, E.Z. Meilikhov, S.D. Lazarev, and B.A. Aronzon Insulators, A.P. Geppe Thermoelectric Phenomena, N.A. Babushkina Electron and Ion Emission, T.M. Lifshits and A.L. Musatov Magnetic Properties of DIA-and Paramagnetics, V.Yu. Ivanov and L.I. Vinokurova Magnetic Properties of Ferromagnetic Metals and Alloys, K.G. Gurtovoi Antiferromagnets, V.I. Ozhogin and V.G. Shapiro Ferrites and Other Magnetic Dielectrics, M.V. Bystrov, V.L. Ivashintseva, S.A. Mironov, and R.V. Pisarev Galvanomagnetic and Thermomagnetic Phenomena, N.A. Babushkina and V.S. Egorov Optical Properties of Substances, L.A. Novitskii Atomic and Molecular Spectra, A.A. Radzig Electro-, Magneto-, and Piezooptical and Nonlinear Optical Effects, A.A. Malyutin, M.E. Brodov, and V.P. Yanovskii Lasers, A.A. Malyutin , E. Brodov, and V.P. Yanovskii X-Ray Radiation, R.M. Imamov Fundamental Particles, V.A.P. Nikitin Nuclear Properties of Nuclides, V.M. Kulakov Mossbauer Nuclei, S.S. Yakimov and V.M. Cherepanov Nuclear Reactions, V.P. Rudakov Nuclear Fission, A.I. Obukhov and I.S. Grigoriev Neutron Penetration Through Matter, S.V. Marin Passage of Ionizing Radiation Through Matter, V.P. Rudakov Cosmic Rays, V.S. Ptuskin Geophysics, I.A. Maslov Astronomy and Astrophysics, Yu. E. Lyubarskii and R.A. Syunyaev.
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Reliable and quickly accessible information concerning the physical phenomena and properties of various media is in great demand by many scientists in their everyday work. This extensive reference provides such information, presenting basic physical parameters and properties of substances employed in modern science and industry. The material is divided into the following branches: Mechanics; Thermodynamics; Transport Phenomena; Electricity and Magnetism Optics and Lasers; Nuclear Physics; Astronomy; and, Geophysics.
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• 1. Radiation, physics and measurement
• 2. Radiation environments (including human risks from the terrestrial environment)
• 3. Response of materials and devices to radiation
• 4. Metal-oxide-semiconductor (MOS) devices
• 5. Bipolar transistors and integrated circuits
• 6. Diodes, solar cells, optoelectronics
• 7. Power semiconductors
• 8. Optical media
• 9. Microelectronics, sensors, MEMs, passives, and other components
• 10. Polymers and other organics
• 11. The interaction of radiation with shielding materials
• 12. Computer methods for particle transport
• 13. Radiation testing
• 14. Radiation-hardening of semiconductor parts
• 15. Equipment hardening and hardness assurance
• APPENDICES
• A. Useful general and geophysical data
• B. Radiation quantities
• C. Useful data on materials used in electronic equipment
• D. Bibliography of dosimeter research
• E. Dose-depth curves for typical Earth orbits, calculated by ESA's Space Environment Information System (SPENVIS) software
• F. Degradation in polymers in ionizing radiation
• G. Useful websites.
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This revised second edition of a popular handbook for engineers describes the important relationship between high-energy radiation environments, electronic device physics and materials. It is a straightforward account of the problems which arise when high-energy radiation bombards matter and of engineering methods for solving those problems. Radiation effects are a problem encountered in the use of highly engineered materials such as semiconductors, optics and polymers. The finely-tuned properties of these materials may change drastically when exposed to a radiation environment such as a beam of X-rays or electrons, the space environment or the 'hadrons' in CERN's new collider. All of these environments and several more are described. At the core of this book is a discussion of the impact of these environments on the devices used in computing, data processing and communication. While unashamedly oriented to the engineer-designer and manager, with descriptions in a highly readable form, there is no compromise in physical accuracy when describing high-energy radiation and the effects it produces, such as electronic failure, coloration and the decay of strength.A great breadth of technical data, such as may be needed to make quick decisions, is presented with literature references and a compendium of web-sites which have been tested and used by the authors.
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• Introduction, Physical Constants and Conversion Factors. Properties of the Normal State. Superconducting State. Models and Theories. Supercondutor Types. R.E. Gladysheviskii and K. Cenzual, Crystal Structures of Classical Superconductors. Cuprates. R.E. Gladyshevskii and Ph. Galez, Crystal Structures of High-Tc Superconducting Cuprates. Characteristic Parameters. Thermal Properties. Electrical Properties. Magnetic Properties. Mechanical Properties. W. Wong-ng, Phase Diagrams of High TC Superconductors.
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The field of superconductivity has tremendous potential for growth and further development in industrial applications. The subject continues to occupy physicists, chemists, and engineers interested in both the phenomena itself and possible financially viable industrial devices utilizing the physical concepts. For the past five years, within the publications of the American Physical Society, for example, 40%-60% of all articles submitted to major journals in the area of Solid State Physics have been on the subject of superconductivity, including the newer, extremely important subfield of high temperature superconductivity (high Tc). The present volume is the first handbook to address this field. It covers both 'classic' superconductivity-related topics and high Tc. Numerous properties, including thermal, electrical, magnetic, mechanical, phase diagrams, and spectroscopic crystallographic structures are presented for many types of superconductors. Critical fields, critical currents, coherence lengths, penetration depths, and transition temperatures are tabulated. This is the first handbook on Superconductivity. Coherence lengths and depths are tabulated. This book describes crystallographic structures of over 100 superconductor types. Main results of several theories are submitted. Phase diagrams for synthesizing new superconductors are included.
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• Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials.
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The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field.
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• Chapter 1: Introduction
• Chapter 2: Automatic Lens Design: Managing the Lens Design Program
• Chapter 3: Improving a Design
• Chapter 4: Evaluation: How Good Is This Design?
• Chapter 5: Lens Design Data
• Chapter 6: Telescope Objectives
• Chapter 7: Eyepieces and Magnifiers
• Chapter 8: Cooke Triplet Anastigmats
• Chapter 9: Split Triplets
• Chapter 10: The Tessar, Hellar, and Other Compounded Triplets
• Chapter 11: Double-Meniscus Anastigmats
• Chapter 12: The Biotar or Double-Gauss Lens
• Chapter 13: Telephoto Lenses
• Chapter 14: Reversed Telephoto (Retrofocus and Fish-Eye) Lenses
• Chapter 15: Wide-Angle Lenses With Negative Outer Elements
• Chapter 16: The Petzval Lens: Head-up Display Lenses
• Chapter 17: Microscope Objectives
• Chapter 18: Mirror and Catadioptric Systems
• Chapter 19: Infrared and Ultraviolet Systems
• Chapter 20: Zoom Lenses
• Chapter 21: Projection TV Lenses and Macro Lenses
• Chapter 22: Scanner/f-o, Laser Disk and Collimator Lenses
• Chapter 23: Tolerance Budgeting
• Chapter 24: Formulary GLOSSARY REFERENCES INDEX.
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The #1 resource in the optics field has been retooled into a "how-to" manual for the lens design process Well-known optics guru Warren J. Smith reveals time-tested methods for designing any major lens type and includes seven fully worked design examples.
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This updated, expanded edition of the classic Physics Vade Mecum is a compact, comprehensive storehouse of the most useful information, formulas, numerical data, definitions, and references, designed for easy access with minimal searching. Saves you time and effort in solving a wide range of scientific and technical problems. A complete listing of physics data centers is included. The index has more than doubled in size from the first edition for even more efficient use. The perfect quick-reference tool. A Library of Science selection.
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• Laser Materials and Their Hosts. Nonliner Optical Crystals. Main Optical Materials. Alkali and Alkaline Earth Halides. Oxides, Sulfides, Selenides and Tellurides. Semiconductors and Other Crystalline Materials. Glasses and Polymers. Liquids. Gases. Appendix. References. Index.
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Properties of Optical and Laser-Related Materials-A Handbook offers the reader a self-contained, concise and up-to-date collection of the key properties of 125 of the most common and important optical materials used in modern optics, laser physics and technology, spectroscopy and laser spectroscopy, nonlinear optics, quantum electronics and laser applications. This comprehensive volume presents not only the classical properties but also those that have appeared in the three decades since the invention of the laser. The presentation of the material is given in a clear tabular form with more than 1000 references. A wide variety of readers, ranging from workers in both industry and academia, to lecturers and students at postgraduate and undergraduate levels, will find Properties of Optical and Laser-Related Materials-A Handbook an invaluable resource.
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