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Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / Petr Klapetek.

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Author/Creator:
Klapetek, Petr.
Language:
English.
Publication date:
2013
Imprint:
1st ed. - Amsterdam ; Boston : William Andrew/Elsevier, 2013.
Format:
  • Book
  • xi, 321 p. : ill. ; 25 cm.
Bibliography:
Includes bibliographical references and index.
Contributor:
Klapetek, Petr.
Series:
Micro and nano technologies series
Micro & nano technologies.
Subjects:
ISBN:
9781455730582
1455730580

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