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Theory of defects in semiconductors / David A. Drabold, Stefan K. Estreicher (eds.).

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Language:
English.
Publication date:
2007
Imprint:
Berlin ; New York : Springer, c2007.
Format:
  • Book
  • xiii, 295 p. : ill. ; 24 cm.
Bibliography:
Includes bibliographical references and index.
Contents:
  • 1. Defect Theroy: An Armchair History.- 2. Supercell Methods for Defect Calculations.- 3. Marker-Method Calculations for Electrical Levels Using Gaussian-orbital Basis-sets.- 4. Dynamical Matrices and Free Energies.- 5. The Calculation of Free Energies in Semiconductors: Defects, Transitions and Phase Diagrams.- 6. Quantum Monte Carlo Techniques and Defects in Semiconductors.- 7. Quasiparticle Calculations for Point Defects at Semiconductor Surfaces.- 8. Multiscale Modelling of Defects in Semiconductors: A Novel Molecular Dynamics Scheme.- 9. Empirical Molecular Dynamics: Possibilities, Requirements, and Limitations.- 10. Defects in Amorphous Semiconductors: Amorphous Silicon.- 11. Light-induced Effects in Amorphous and Glassy Solids.
  • (source: Nielsen Book Data)
Publisher's Summary:
Semiconductor science and technology is the art of defect engineering. The theoretical modeling of defects has improved dramatically over the past decade. These tools are now applied to a wide range of materials issues: quantum dots, buckyballs, spintronics, interfaces, amorphous systems, and many others. This volume presents a coherent and detailed description of the field, and brings together leaders in theoretical research. Today's state-of-the-art as well as tomorrow's tools are discussed: the supercell-pseudopotential method, the GW formalism, Quantum Monte Carlo, learn-on-the-fly molecular dynamics, finite-temperature treatments, etc. A wealth of applications is included, from point defects to wafer bonding or the propagation of dislocation.
(source: Nielsen Book Data)
Note:
Also available on the World Wide Web.
Contributor:
Drabold, D. A. (David A.)
Estreicher, Stefan K., 1952-
Series:
Topics in applied physics, 0303-4216 ; v. 104
Topics in applied physics ; v. 104.
Subjects:
ISBN:
3540334009
9783540334002

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