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Electron and photon impact ionization and related topics 2004 : proceedings of the International Conference on Electron and Photon Impact Ionization and Related Topics, Louvain-la-Neuve, Belgium, 1-3 July 2004 / edited by B. Piraux.

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Meeting:
International Conference on Electron and Photon Impact Ionization and Related Topics (2004 : Louvain-la-Neuve, Belgium)
Language:
English.
Publication date:
2005
Imprint:
Bristol, UK ; Philadelphia, PA : IoP, Institute of Physics Publishing, c2005.
Format:
  • Book, Conference Proceedings
  • 197 p., [1] leaf of plates : ill. (some col.) ; 24 cm.
Bibliography:
Includes bibliographical references and index.
Publisher's Summary:
"Electron and Photon Impact Ionization and Related Topics 2004" provides an overview of the latest advances in the field of ionization by electron and photon impact. The book contains 18 contributions of recent experimental, theoretical, and computational work on correlated processes that involve a wide range of targets, including atoms, molecules, clusters, and surfaces. It covers a broad range of current topics, such as multi-particle coincidence studies, in particular, (e, 2e) and (e, 3e) processes, photoionization with or without excitation, and multiphoton single and double ionization.The three chapters contain the following topics: anisotropy and polarization in Auger-electron emission, multiple ionization of atoms in strong fields, and theoretical and practical aspects of photoionization with excitation. Because of the extensive array of applications discussed, this book is an essential reference for chemists, biologists, and researchers working in atomic, molecular, cluster, and surface physics.
(source: Nielsen Book Data)
Contributor:
Piraux, Bernard.
Institute of Physics (Great Britain)
Series:
Institute of Physics conference series ; no. 183.
Subjects:
ISBN:
075031009X
9780750310093

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