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Measuring the performance and intelligence of systems [microform] : proceedings of the 2000 PerMIS Workshop, August 14-16, 2000 / edited by A.M. Meystel, E.R. Messina ; co-sponsored by: National Institute of Standards and Technology ... [et al.].

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Meeting:
PerMIS Workshop (2000 : National Institute of Standards and Technology)
Language:
English
Imprint:
Gaithersburg, Md. : The Institute ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Format:
  • Book, Conference Proceedings, Microformat
  • xi, 658 p. : ill. ; 28 cm.
Note:
"September 2001." Shipping list no.: 2002-0120-M.
Bibliography:
Includes bibliographical references and index.
Reproduction:
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 7 microfiches : negative.
Contributor:
Meystel, A. (Alex)
Messina, E. R.
National Institute of Standards and Technology (U.S.)
Series:
NIST special publication ; 970.
Subjects:

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