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Cluster secondary ion mass spectrometry [electronic resource] : principles and applications / edited by Christine M. Mahoney.

Availability

Online

Other libraries

Author/Creator:
Mahoney, Christine M., 1975-
Language:
English.
Publication date:
2013
Imprint:
Hoboken, New Jersey : Wiley, c2013.
Format:
  • Book
  • 1 online resource (350 p.)
Summary:
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
Available in another form:
Print version: Mahoney, Christine M. Cluster secondary ion mass spectrometry. Hoboken, New Jersey : John Wiley, c2013 0470886056 (OCoLC)816563294
Series:
Wiley series on mass spectrometry
Wiley-Interscience series on mass spectrometry.
Subjects:
ISBN:
9781118589335
1118589335
9781118589250
1118589254

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