Applied logistic regression

Author/Creator
Hosmer, David W.
Language
English.
Edition
3rd ed.
Imprint
Hoboken, N.J. : Wiley, c2013.
Physical description
xvi, 500 p. : ill. ; 24 cm.
Series
Wiley series in probability and statistics 398.

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Librarian view | Catkey: 10164492